Patents by Inventor Kwang-Ill Kho
Kwang-Ill Kho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9488472Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: GrantFiled: August 19, 2014Date of Patent: November 8, 2016Assignee: KOH YOUNG TECHNOLOGY INC.Inventors: Seung-Jun Lee, Kwang-Ill Kho, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur
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Patent number: 9243900Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: GrantFiled: August 19, 2014Date of Patent: January 26, 2016Assignee: KOH YOUNG TECHNOLOGY INC.Inventors: Seung-Jun Lee, Kwang-Ill Kho, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur
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Publication number: 20140354804Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: ApplicationFiled: August 19, 2014Publication date: December 4, 2014Inventors: Seung-Jun LEE, Kwang-Ill KHO, Moon-Young JEON, Sang-Kyu YUN, Hong-Min KIM, Jung HUR
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Patent number: 8878929Abstract: A three dimensional shape measurement apparatus includes m projecting sections, each of which includes a light source and a grating element, and, while moving the grating element by n times, projects a grating pattern light onto a measurement target for each movement, wherein the ‘n’ and the ‘m’ are natural numbers greater than or equal to 2, an imaging section photographing a grating pattern image reflected by the measurement target, and a control section controlling that, while photographing the grating pattern image by using one of the m projecting sections, a grating element of at least another projecting section is moved. Thus, measurement time may be reduced.Type: GrantFiled: May 26, 2010Date of Patent: November 4, 2014Assignee: Koh Young Technology Inc.Inventors: Ho Kim, Kwang-Ill Kho, Hee-Wook You, Jae-Myeong Song
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Patent number: 8854610Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: GrantFiled: February 25, 2009Date of Patent: October 7, 2014Assignee: Koh Young Technology Inc.Inventors: Seung-Jun Lee, Kwang-Ill Kho, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur
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Publication number: 20140010438Abstract: A three dimensional shape measurement apparatus includes m projecting sections, each of which includes a light source and a grating element, and, while moving the grating element by n times, projects a grating pattern light onto a measurement target for each movement, wherein the ‘n’ and the ‘m’ are natural numbers greater than or equal to 2, an imaging section photographing a grating pattern image reflected by the measurement target, and a control section controlling that, while photographing the grating pattern image by using one of the m projecting sections, a grating element of at least another projecting section is moved. Thus, measurement time may be reduced.Type: ApplicationFiled: September 9, 2013Publication date: January 9, 2014Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Ho KIM, Kwang-Ill Kho, Hee-Wook You, Jae-Myeong Song
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Patent number: 8260030Abstract: In order to set an inspection area, a measurement target is disposed onto a stage, a reference data of the measurement target is summoned, and a measurement data of the measurement target is acquired. Then, at least one feature object is selected in the measurement data and the reference data of the measurement target, and at least one feature variable for the selected feature object is extracted from each of the reference data and the measurement data. Thereafter, a change amount of the measurement target is produced by using the feature variable and a quantified conversion formula, and the produced change amount is compensated for to set an inspection area. Thus, the distortion of the measurement target is compensated for to correctly set an inspection area.Type: GrantFiled: March 29, 2010Date of Patent: September 4, 2012Assignee: Koh Young Technology Inc.Inventors: Hee-Tae Kim, Bong-Ha Hwang, Seung-Jun Lee, Kwang-Ill Kho
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Publication number: 20110050893Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: ApplicationFiled: February 25, 2009Publication date: March 3, 2011Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Seung-Jun Lee, Kwang-Ill Kho, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur
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Publication number: 20100302364Abstract: A three dimensional shape measurement apparatus includes m projecting sections, each of which includes a light source and a grating element, and, while moving the grating element by n times, projects a grating pattern light onto a measurement target for each movement, wherein the ‘n’ and the ‘m’ are natural numbers greater than or equal to 2, an imaging section photographing a grating pattern image reflected by the measurement target, and a control section controlling that, while photographing the grating pattern image by using one of the m projecting sections, a grating element of at least another projecting section is moved. Thus, measurement time may be reduced.Type: ApplicationFiled: May 26, 2010Publication date: December 2, 2010Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Ho KIM, Kwang-Ill KHO, Hee-Wook YOU, Jae-Myeong SONG
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Publication number: 20100246931Abstract: In order to set an inspection area, a measurement target is disposed onto a stage, a reference data of the measurement target is summoned, and a measurement data of the measurement target is acquired. Then, at least one feature object is selected in the measurement data and the reference data of the measurement target, and at least one feature variable for the selected feature object is extracted from each of the reference data and the measurement data. Thereafter, a change amount of the measurement target is produced by using the feature variable and a quantified conversion formula, and the produced change amount is compensated for to set an inspection area. Thus, the distortion of the measurement target is compensated for to correctly set an inspection area.Type: ApplicationFiled: March 29, 2010Publication date: September 30, 2010Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Hee-Tae KIM, Bong-Ha HWANG, Seung-Jun LEE, Kwang-Ill KHO