Patents by Inventor Kwang-Jun Yoon
Kwang-Jun Yoon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11202751Abstract: The present invention relates to a cosmetic composition for whitening comprising a Caragana sinica root extract, and more specifically relates to a cosmetic composition having an outstanding skin-whitening effect, the composition comprising a Caragana sinica root extract, a fraction thereof or ?-viniferin isolated therefrom. In the present invention, the Caragana sinica root extract, fraction thereof or ?-viniferin isolated therefrom inhibits tyrosinase activity and suppresses melanin production and is therefore effective in skin whitening.Type: GrantFiled: June 29, 2016Date of Patent: December 21, 2021Assignees: CELLTRION INC., COSEEDBIOPHARM CO., LTD.Inventors: Sung Min Park, Jung No Lee, Hyo Min Kim, Jae Mun Kim, Kwang Jun Yoon, Seung Ki Lee, Jae Hun Kim, Yeon Sook Kim, Joo Hyuck Lim, Heyong Mi Kim, Sung Ho Moon
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Publication number: 20200390842Abstract: The present invention relates to a composition comprising natural plant extracts for alleviating inflammation caused by yellow dust and fine particulate, wherein the plant extracts of the present invention inhibit a production of NO caused by the yellow dust and fine particulate and a production of inflammatory cytokines, thus having an excellent effect on preventing or alleviating skin inflammation caused by the yellow dust, fine particulate and other harmful substances.Type: ApplicationFiled: June 19, 2020Publication date: December 17, 2020Inventors: Jae Hun Kim, Seung Ki Lee, Joo Hyuck Lim, Yeon Sook Kim, Won Kang Moon, Chi Ho Choi, Kwang Jun Yoon, Sung Ho Moon, Sung Hyun Lee, Myeong Hun Yeom, Soo Mi Ahn, Kyoung Wook Kim, Mi Kyung Sung, Young Pyo Jang, Jinju Kim
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Publication number: 20180207222Abstract: The present invention relates to a composition comprising natural plant extracts for alleviating inflammation caused by yellow dust and fine particulate, wherein the plant extracts of the present invention inhibit a production of NO caused by the yellow dust and fine particulate and a production of inflammatory cytokines, thus having an excellent effect on preventing or alleviating skin inflammation caused by the yellow dust, fine particulate and other harmful substances.Type: ApplicationFiled: September 7, 2016Publication date: July 26, 2018Inventors: Jae Hun Kim, Seung Ki Lee, Joo Hyuck Lim, Yeon Sook Kim, Won Kang Moon, Chi Ho Choi, Kwang Jun Yoon, Sung Ho Moon, Sung Hyun Lee, Myeong Hun Yeom, Soo Mi Ahn, Kyoung Wook Kim, Mi Kyung Sung, Young Pyo Jang, Jinju Kim
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Publication number: 20180185269Abstract: The present invention relates to a cosmetic composition for whitening comprising a Caragana sinica root extract, and more specifically relates to a cosmetic composition having an outstanding skin-whitening effect, the composition comprising a Caragana sinica root extract, a fraction thereof or ?-viniferin isolated therefrom. In the present invention, the Caragana sinica root extract, fraction thereof or ?-viniferin isolated therefrom inhibits tyrosinase activity and suppresses melanin production and is therefore effective in skin whitening.Type: ApplicationFiled: June 29, 2016Publication date: July 5, 2018Inventors: Sung Min PARK, Jung No LEE, Hyo Min KIM, Jae Mun KIM, Kwang Jun YOON, Seung Ki LEE, Jae Hun KIM, Yeon Sook KIM, Joo Hyuck LIM, Heyong Mi KIM, Sung Ho MOON
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Patent number: 9903705Abstract: An automatic focus control apparatus includes a light detector, which receives light reflected by a surface of a wafer and generates a light reception signal based on the received signal, a controller, which generates a driving signal, the driving signal being one of a first signal and a second signal, the driving signal indicating whether to perform automatic focus control based on the light reception signal, a focus error corrector, which generates a focus error correction signal based on the driving signal, and a stage driver, which displaces a wafer stage supporting the wafer by adjusting the z-axis position of the wafer stage based on the focus error correcting signal if the driving signal is the first signal, and maintains the z-axis position of the wafer stage based on the focus error correction signal if the driving signal is the second signal.Type: GrantFiled: July 11, 2016Date of Patent: February 27, 2018Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Kwang-soo Kim, Harutaka Sekiya, Kwang-jun Yoon, Sung-won Park, Young-duk Kim, Heon-ju Shin, Byeong-hwan Jeon
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Publication number: 20170108329Abstract: An automatic focus control apparatus includes a light detector, which receives light reflected by a surface of a wafer and generates a light reception signal based on the received signal, a controller, which generates a driving signal, the driving signal being one of a first signal and a second signal, the driving signal indicating whether to perform automatic focus control based on the light reception signal, a focus error corrector, which generates a focus error correction signal based on the driving signal, and a stage driver, which displaces a wafer stage supporting the wafer by adjusting the z-axis position of the wafer stage based on the focus error correcting signal if the driving signal is the first signal, and maintains the z-axis position of the wafer stage based on the focus error correction signal if the driving signal is the second signal.Type: ApplicationFiled: July 11, 2016Publication date: April 20, 2017Applicant: Samsung Electronics Co., Ltd.Inventors: KWANG-SOO KIM, Harutaka SEKIYA, Kwang-jun YOON, Sung-won PARK, Young-duk KIM, Heon-ju SHIN, Byeong-hwan JEON
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Patent number: 7280233Abstract: For an automatic defect inspection of an edge exposure area of a wafer, an optical unit supplies a light beam onto the edge portion of a wafer and a detection unit detects light reflected from the edge portion. The detection unit converts the detected light into an electrical signal to transmit the electrical signal to a processing unit. The processing unit analyzes the electrical signal to measure the reflectivity of the edge portion, compares the measured reflectivity with a reference reflectivity, and calculates the width of the edge exposure area. The processing unit compares the calculated width with a reference width to detect any defect in the edge exposure area.Type: GrantFiled: February 27, 2004Date of Patent: October 9, 2007Assignee: Samsung Electronics Co., Ltd.Inventors: Koung-Su Shin, Sun-Yong Choi, Chung-Sam Jun, Dong-Chun Lee, Kwang-Jun Yoon
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Patent number: 7274471Abstract: A system and method of measuring a distance of semiconductor patterns is provided. The system includes a microscope and a control unit. The control unit calculates standard coordinates of standard points in view-fields that include spots, spot coordinates of spots with respect to standard points, real coordinates of spots from both of the standard coordinates and spot coordinates, and finally the distance between the two spots from the first and second real coordinates. Coordinates are determined using high magnification, in conjunction with pixel counting, allowing more precise distance measurements.Type: GrantFiled: December 13, 2004Date of Patent: September 25, 2007Assignee: Samsung Electronics Co., Ltd.Inventors: Koung-Su Shin, Kwang-Jun Yoon, Sun-Yong Choi, Chung-Sam Jun, Dong-Jin Park
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Publication number: 20050134867Abstract: A system and method of measuring a distance of semiconductor patterns is provided. The system includes a microscope and a control unit. The control unit calculates standard coordinates of standard points in view-fields that include spots, spot coordinates of spots with respect to standard points, real coordinates of spots from both of the standard coordinates and spot coordinates, and finally the distance between the two spots from the first and second real coordinates. Coordinates are determined using high magnification, in conjunction with pixel counting, allowing more precise distance measurements.Type: ApplicationFiled: December 13, 2004Publication date: June 23, 2005Inventors: Koung-Su Shin, Kwang-Jun Yoon, Sun-Yong Choi, Chung-Sam Jun, Dong-Jin Park
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Publication number: 20040169869Abstract: For an automatic defect inspection of an edge exposure area of a wafer, an optical unit supplies a light beam onto the edge portion of a wafer and a detection unit detects light reflected from the edge portion. The detection unit converts the detected light into an electrical signal to transmit the electrical signal to a processing unit. The processing unit analyzes the electrical signal to measure the reflectivity of the edge portion, compares the measured reflectivity with a reference reflectivity, and calculates the width of the edge exposure area. The processing unit compares the calculated width with a reference width to detect any defect in the edge exposure area.Type: ApplicationFiled: February 27, 2004Publication date: September 2, 2004Inventors: Koung-Su Shin, Sun-Yong Choi, Chung-Sam Jun, Dong-Chun Lee, Kwang-Jun Yoon
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Publication number: 20030007595Abstract: A method of reconstructing a tomogram of an X-ray apparatus. The tomogram reconstructing method includes obtaining model information and a transmission image of a subject. A tomogram is reconstructed from the transmission image using the model information. The reconstructed tomogram obtained is then displayed.Type: ApplicationFiled: January 24, 2002Publication date: January 9, 2003Inventors: Hyeong-Cheol Kim, Won Choi, Jae-Hyun Jung, Yong-Won Kim, Hyoung-Jo Jeon, Seung-Hwan Choi, Hyun-Kwon Jung, Kwang-Jun Yoon, Jun-Bo Kim, Kyoung-Mu Lee
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Patent number: 6501823Abstract: A method of reconstructing a tomogram of an X-ray apparatus. The tomogram reconstructing method includes obtaining model information and a transmission image of a subject. A tomogram is reconstructed from the transmission image using the model information. The reconstructed tomogram obtained is then displayed.Type: GrantFiled: January 24, 2002Date of Patent: December 31, 2002Assignee: Samsung Electronics Co., Ltd.Inventors: Hyeong-Cheol Kim, Won Choi, Jae-Hyun Jung, Yong-Won Kim, Hyoung-Jo Jeon, Seung-Hwan Choi, Hyun-Kwon Jung, Kwang-Jun Yoon, Jun-Bo Kim, Kyoung-Mu Lee
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Publication number: 20020166802Abstract: Disclosed herein is a battery inspection system. The battery inspection system includes a battery feeding conveyor for feeding batteries to be inspected. One or more transfer robots are positioned near the rear end of the battery feeding conveyor for transferring batteries fed through the battery feeding conveyor to inspection and discharge positions. An X-ray generator is positioned under the transfer robots for applying X-rays to batteries transferred by the transfer robots. A satisfactory battery discharging conveyor is positioned near the transfer robots for discharging satisfactory battery moved by the transfer robots and having been inspected. A defective battery discharging robot is positioned near the front end of the satisfactory battery discharging conveyor for removing defective batteries from batteries moving along the satisfactory battery discharging conveyor and having been inspected.Type: ApplicationFiled: October 1, 2001Publication date: November 14, 2002Inventors: Jae-Hyun Jung, Kwang-Jun Yoon, Hyeong-Cheol Kim, Yong-Won Kim, Won Choi, Hyoung-Jo Jeon, Hyun-Kwon Jung
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Patent number: 6480002Abstract: Disclosed herein is a battery inspection system. The battery inspection system includes a battery feeding conveyor for feeding batteries to be inspected. One or more transfer robots are positioned near the rear end of the battery feeding conveyor for transferring batteries fed through the battery feeding conveyor to inspection and discharge positions. An X-ray generator is positioned under the transfer robots for applying X-rays to batteries transferred by the transfer robots. A satisfactory battery discharging conveyor is positioned near the transfer robots for discharging satisfactory battery moved by the transfer robots and having been inspected. A defective battery discharging robot is positioned near the front end of the satisfactory battery discharging conveyor for removing defective batteries from batteries moving along the satisfactory battery discharging conveyor and having been inspected.Type: GrantFiled: October 1, 2001Date of Patent: November 12, 2002Assignee: Samsung Electronics Co., Ltd.Inventors: Jae-Hyun Jung, Kwang-Jun Yoon, Hyeong-Cheol Kim, Yong-Won Kim, Won Choi, Hyoung-Jo Jeon, Hyun-Kwon Jung
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Patent number: 6415014Abstract: Disclosed herein is a three-dimensional image constructing method using an X-ray apparatus. In the three-dimensional image constructing method, a construction space of a subject and information for the construction space are set. Thereafter, a plurality of transmission images of the subject are obtained. The data of the construction space are calculated on the basis of the information for the construction space set at the setting step and the transmission images obtained at the image obtaining step. The construction space is constructed on the basis of the data calculated at the image processing step.Type: GrantFiled: October 1, 2001Date of Patent: July 2, 2002Assignee: Samsung Electronics Co., Ltd.Inventors: Hyeong-Cheol Kim, Hyoung-Jo Jeon, Jae-Hyun Jung, Yong-Won Kim, Won Choi, Kwang-Jun Yoon, Hyun-Kwon Jung, Jun-Bo Kim, Jae-Wan Kim, Young-Jun Roh, Hyung-Suck Cho