Patents by Inventor Kwang-Sup Kim
Kwang-Sup Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12138913Abstract: Provided are a control unit that predicts the life of an inkjet head unit and maximizes its life to be used, and a substrate treating apparatus including the same. The control unit performs maintenance of an inkjet head unit for discharging a substrate treatment liquid onto a substrate and comprises a count module for counting the number of discharges for each nozzle of the inkjet head unit, a comparison module for comparing the number of discharges with a reference value to determine whether the number of discharges is equal to or greater than the reference value, and an evaluation module for evaluating whether a life of the inkjet head unit has reached a usable life based on whether the number of discharges of each nozzle is equal to or greater than the reference value.Type: GrantFiled: July 29, 2022Date of Patent: November 12, 2024Assignee: SEMES CO., LTD.Inventors: Yeon Chul Song, Myeong Jun Lim, Kwang Sup Kim, Jong Min Lee, Jun Ho Oh, Ji Hoon Yoo, Young Ho Park
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Patent number: 12123903Abstract: A static electricity visualization apparatus capable of visually identifying a measured level of static electricity is provided.Type: GrantFiled: June 10, 2022Date of Patent: October 22, 2024Assignee: SEMES CO., LTD.Inventors: Jun Ho Oh, Kwang Sup Kim, Jae Hong Kim, Kyung Hun Jang, Young Ho Park, Jong Min Lee, Yeon Chul Song, Sang Min Ha, Ji Hoon Yoo, Myeong Jun Lim
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Publication number: 20240160486Abstract: A computing resource management system using software modularization in a cluster computing environment in which computing devices are connected, including an application process running on each computing device and an algorithm processing process configured to run independently of the application process and perform task processing on the application process, the computing resource management system including: a task managing system configured to receive a task request message from an application process requiring a task from each computing device; a process managing system configured to confirm an algorithm processing process of computing devices connected to the cluster computing environment, and determine whether there is an algorithm processing process in an idle state to which the application process requested for a task will be assigned; and a performed managing system configured to confirm a result of an application process whose task is performed by the algorithm processing process.Type: ApplicationFiled: October 17, 2023Publication date: May 16, 2024Inventors: Sang Hyun SON, Yeon Chul Song, Myeong Jun Lim, Ji Hoon Yoo, Kwang Sup Kim, Jong Min Lee, Young Ho Park, Jun Ho Oh, Joong Chol Shin, Hyun Cheol Cho
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Publication number: 20240139934Abstract: The inventive concept provides a teaching method for teaching a transfer position of a transfer robot. The teaching method includes: searching for an object on which a target object to be transferred by the transfer robot is placed, based on a 3D position information acquired by a first sensor; and acquiring coordinates of a second direction and coordinates of a third direction of the object based on a data acquired from a second sensor which is a different type from the first sensor.Type: ApplicationFiled: March 8, 2023Publication date: May 2, 2024Applicant: SEMES CO., LTD.Inventors: Jong Min Lee, Kwang Sup Kim, Myeong Jun Lim, Young Ho Park, Yeon Chul Song, Sang Hyun Son, Jun Ho Oh, Ji Hoon Yoo, Joong Chol Shin
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Publication number: 20230213876Abstract: The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a support unit configured to rotate and support a substrate; a liquid supply unit configured to supply a liquid to the substrate supported on the support unit; and an optical module for heating the substrate supported on the support unit, and wherein the support unit includes a teaching member having a grid displaying a reference point which matches a center of the support unit.Type: ApplicationFiled: December 29, 2022Publication date: July 6, 2023Applicant: SEMES CO., LTD.Inventors: Hyo Won YANG, Hyun Yoon, Young Ho Park, Tae Hee Kim, In Ki Jung, Kwang Sup Kim
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Publication number: 20230203669Abstract: Disclosed is a method for treating a substrate, on which a plurality of reference marks and a pattern are formed. The method includes a process preparing operation, a location information acquiring operation of acquiring information on an actual location of the pattern, and a process executing operation of supplying a treatment liquid to the substrate, and heating the substrate by irradiating laser light to the pattern on the substrate, to which the treatment liquid is applied, the location information acquiring operation includes acquiring information on actual locations of, among the plurality of reference marks, at least three reference marks, and acquiring information of the actual location of the pattern through the information of the actual locations of the reference marks.Type: ApplicationFiled: December 22, 2022Publication date: June 29, 2023Inventors: Shin Hwa KANG, Seung Un OH, Young Ho PARK, Sang Hyeon RYU, Kwang Sup KIM
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Publication number: 20230204648Abstract: A static electricity visualization apparatus capable of visually identifying a measured level of static electricity is provided.Type: ApplicationFiled: June 10, 2022Publication date: June 29, 2023Inventors: Jun Ho OH, Kwang Sup KIM, Jae Hong KIM, Kyung Hun JANG, Young Ho PARK, Jong Min LEE, Yeon Chul SONG, Sang Min HA, Ji Hoon YOO, Myeong Jun LIM
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Publication number: 20230207349Abstract: Disclosed is a substrate treating apparatus. The substrate treating apparatus includes a body including an irradiation end, from which laser light is irradiated, a shaft coupled to the body, and a driver that supplies power to the shaft, the heating unit is swung about an axis of the shaft, and the controller moves the irradiation end of the heating unit to a target location on a substrate by adjusting a rotation angle of the heating unit and a rotation angle of the support unit.Type: ApplicationFiled: December 20, 2022Publication date: June 29, 2023Inventors: Kwang Sup KIM, Seung Un OH, Shin Hwa KANG, Sang Hyeon RYU, Young Ho PARK
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Publication number: 20230206424Abstract: Provided are a nozzle inspection unit configured to generate a large amount of defect data to improve detection accuracy of a defective nozzle, and a substrate treatment apparatus including the same. The nozzle inspection unit includes: a data collection module configured to collect a plurality of image data related to nozzles; a data classification module configured to classify the plurality of image data according to predefined classes; a data merging module configured to merge good image data related to a normal nozzle and defect image data related to a defective nozzle from among the plurality of image data; a data training module configured to train a plurality of merged image data obtained through the data merging module; and a defect data generation module configured to generate a plurality of final image data from the plurality of merged image data based on the training result.Type: ApplicationFiled: December 6, 2022Publication date: June 29, 2023Inventors: Myeong Jun LIM, Kwang Sup KIM, Yeon Chul SONG, Ji Hoon YOO, Jong Min LEE, Jun Ho OH, Young Ho PARK
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Publication number: 20230206415Abstract: Provided are a substrate inspecting unit capable of reducing image data labeling work time through training image data set verification and semi-automatic image labeling, and at the same time, improving prediction performance by improving classification accuracy for data sets, and a substrate treating apparatus including the same. The substrate inspecting unit comprises a feature extracting module for extracting a feature from training data included in each class in response to a plurality of training data related to image data of a substrate being classified according to a predefined class, a validity evaluating module for evaluating validity of the feature, a class verifying module for verifying the predefined class, and a data reconstructing module for reconstructing the plurality of training data based on a feature determined as valid and a verified class, wherein reconstructed training data is utilized when inspecting the substrate.Type: ApplicationFiled: December 7, 2022Publication date: June 29, 2023Inventors: Ji Hoon YOO, Kwang Sup KIM, Jong Min LEE, Yeon Chul SONG, Jun Ho OH, Young Ho PARK, Myeong Jun LIM
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Publication number: 20230138430Abstract: A method for generating an adaptive training image dataset capable of improving prediction accuracy is provided.Type: ApplicationFiled: June 24, 2022Publication date: May 4, 2023Inventors: Ji Hoon YOO, Kwang Sup KIM, Jong Min LEE, Yeon Chul SONG, Jun Ho OH, Young Ho PARK, Myeong Jun LIM
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Publication number: 20230116619Abstract: A static electricity visualization system capable of visually confirming the level of the measured static electricity is provided. The static electricity visualization system comprises a first measuring unit for measuring a static electricity level detected at a first position of a measurement target and comprising a first mark, a photographing unit for generating a photographed image by photographing the measurement target, a processor for recognizing a first mark in the photographed image and calculating coordinates of the first mark on the photographed image, and an output unit for outputting a static electricity visualization image that visualizes the static electricity level measured by the first measuring unit in a first mode, wherein the static electricity visualization image comprises a color corresponding to a level of static electricity measured by the first measuring unit on the coordinates of the first mark of the photographed image.Type: ApplicationFiled: May 12, 2022Publication date: April 13, 2023Inventors: Jun Ho OH, Kwang Sup KIM, Jong Min LEE, Yeon Chul SONG, Young Ho PARK, Ji Hoon YOO, Myeong Jun LIM
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Publication number: 20230101546Abstract: Provided are a control unit that predicts the life of an inkjet head unit and maximizes its life to be used, and a substrate treating apparatus including the same. The control unit performs maintenance of an inkjet head unit for discharging a substrate treatment liquid onto a substrate and comprises a count module for counting the number of discharges for each nozzle of the inkjet head unit, a comparison module for comparing the number of discharges with a reference value to determine whether the number of discharges is equal to or greater than the reference value, and an evaluation module for evaluating whether a life of the inkjet head unit has reached a usable life based on whether the number of discharges of each nozzle is equal to or greater than the reference value.Type: ApplicationFiled: July 29, 2022Publication date: March 30, 2023Inventors: Yeon Chul SONG, Myeong Jun Lim, Kwang Sup Kim, Jong Min Lee, Jun Ho Oh, Ji Hoon Yoo, Young Ho Park
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Patent number: 11577506Abstract: Disclosed are an apparatus and a method for quickly and accurately inspecting a droplet on a substrate. An apparatus for inspecting a droplet on a substrate according to an exemplary embodiment of the present disclosure includes: an ultrasonic sensor configured to apply an ultrasonic wave to a droplet on the substrate and detect an ultrasonic wave reflected from the substrate; and a processor configured to acquire a height of the droplet at each position on the substrate on the basis of a signal of the ultrasonic wave reflected from the droplet on the substrate, calculate a volume of the droplet on the basis of the heights of the droplet at the positions, and store or output data in relation to the volume of the droplet. The embodiment of the present disclosure may calculate the volume of the droplet using the ultrasonic wave, thereby quickly and accurately inspecting the droplet on the substrate.Type: GrantFiled: September 5, 2021Date of Patent: February 14, 2023Assignee: SEMES CO., LTD.Inventors: Kwang Sup Kim, Dong Ok Ahn, Jong Min Lee, Jun Ho Oh, Ji Hoon Yoo, Young Ho Park
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Patent number: 11495467Abstract: Method and apparatus for etching a thin layer including silicon nitride formed on a substrate are disclosed. Etchant including phosphoric acid and water is supplied on the substrate so that a liquid layer is formed on the substrate. The thin layer is etched by reaction between the thin layer and the etchant. Thickness of the liquid layer is measured to detect variation in the thickness of the liquid layer while etching the thin layer. Variation in the concentration of the phosphoric acid and the water is calculated based on the variation in the thickness of the liquid layer. Water is supplied on the substrate based on the variation in the concentration of the phosphoric acid and the water so that the concentration of the phosphoric acid and the water becomes a predetermined value.Type: GrantFiled: December 8, 2020Date of Patent: November 8, 2022Assignee: SEMES CO., LTD.Inventors: Jung Suk Goh, Jae Seong Lee, Do Youn Lim, Kuk Saeng Kim, Young Dae Chung, Tae Shin Kim, Jee Young Lee, Won Geun Kim, Ji Hoon Jeong, Kwang Sup Kim, Pil Kyun Heo, Yoon Ki Sa, Ye Rim Yeon, Hyun Yoon, Do Yeon Kim, Yong Jun Seo, Byeong Geun Kim, Young Je Um
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Publication number: 20220072848Abstract: Disclosed are an apparatus and a method for quickly and accurately inspecting a droplet on a substrate. An apparatus for inspecting a droplet on a substrate according to an exemplary embodiment of the present disclosure includes: an ultrasonic sensor configured to apply an ultrasonic wave to a droplet on the substrate and detect an ultrasonic wave reflected from the substrate; and a processor configured to acquire a height of the droplet at each position on the substrate on the basis of a signal of the ultrasonic wave reflected from the droplet on the substrate, calculate a volume of the droplet on the basis of the heights of the droplet at the positions, and store or output data in relation to the volume of the droplet. The embodiment of the present disclosure may calculate the volume of the droplet using the ultrasonic wave, thereby quickly and accurately inspecting the droplet on the substrate.Type: ApplicationFiled: September 5, 2021Publication date: March 10, 2022Applicant: SEMES CO., LTD.Inventors: Kwang Sup KIM, Dong Ok AHN, Jong Min LEE, Jun Ho OH, Ji Hoon YOO, Young Ho PARK
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Publication number: 20210183660Abstract: Method and apparatus for etching a thin layer including silicon nitride formed on a substrate are disclosed. Etchant including phosphoric acid and water is supplied on the substrate so that a liquid layer is formed on the substrate. The thin layer is etched by reaction between the thin layer and the etchant. Thickness of the liquid layer is measured to detect variation in the thickness of the liquid layer while etching the thin layer. Variation in the concentration of the phosphoric acid and the water is calculated based on the variation in the thickness of the liquid layer. Water is supplied on the substrate based on the variation in the concentration of the phosphoric acid and the water so that the concentration of the phosphoric acid and the water becomes a predetermined value.Type: ApplicationFiled: December 8, 2020Publication date: June 17, 2021Applicant: SEMES CO., LTD.Inventors: Jung Suk GOH, Jae Seong LEE, Do Youn LIM, Kuk Saeng KIM, Young Dae CHUNG, Tae Shin KIM, Jee Young LEE, Won Geun KIM, Ji Hoon JEONG, Kwang Sup KIM, Pil Kyun HEO, Yoon Ki SA, Ye Rim YEON, Hyun YOON, Do Yeon KIM, Yong Jun SEO, Byeong Geun KIM, Young Je UM
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Patent number: 8881575Abstract: Provided are an apparatus for collecting gas samples in a foam and an analysis method using the same, and more particularly, to an apparatus for collecting gas samples in a foam in which the foam is grinded, such that the gas sample in the foam may be effectively collected, and pressure before and after collection of the gas samples may be measured to thereby increase accuracy of gas analysis, such that characteristics of the foam may be more accurately evaluated, and an analysis method using the same.Type: GrantFiled: December 15, 2009Date of Patent: November 11, 2014Assignee: Korea Research Institute of Standards and ScienceInventors: Jin-Bok Lee, Jin-Seog Kim, Dong-Min Moon, Kwang-Sup Kim, Jeong-Soon Lee
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Publication number: 20110247395Abstract: Provided are an apparatus for collecting gas samples in a foam and an analysis method using the same, and more particularly, to an apparatus for collecting gas samples in a foam in which the foam is grinded, such that the gas sample in the foam may be effectively collected, and pressure before and after collection of the gas samples may be measured to thereby increase accuracy of gas analysis, such that characteristics of the foam may be more accurately evaluated, and an analysis method using the same.Type: ApplicationFiled: December 15, 2009Publication date: October 13, 2011Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCEInventors: Jin-Bok Lee, Jin-Seog Kim, Dong-Min Moon, Kwang-Sup Kim, Jeong-Soon Lee
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Patent number: 7981551Abstract: The present invention relates to an electrolyte for a lithium ion rechargeable battery and a lithium ion rechargeable battery including the same. The electrolyte includes a non-aqueous organic solvent, a lithium salt, and triphenyl phosphate. A lithium ion rechargeable battery including the electrolyte has improved overcharge stability and shows excellent chemical properties including reducing swelling, high-temperature storage stability, and cycle life characteristics.Type: GrantFiled: May 31, 2005Date of Patent: July 19, 2011Assignee: Samsung SDI Co., Ltd.Inventors: Cheon Soo Kim, Hyung Bok Lee, Kwang Sup Kim, Sang Ho Lee, Joong Heon Kim, Tae Shik Earmme, Kwang Soo Yeo, Chan Hee Lee