Patents by Inventor Kwangui Ko

Kwangui Ko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7696535
    Abstract: A gallium nitride high electron mobility transistor, in which an inner field-plate is disposed between the gate and drain of the high electron mobility transistor, so that an electric field is distributed between gate and drain regions to reduce a peak value and to reduce gate leakage current while maintaining high frequency performance, thus obtaining a high breakdown voltage, reducing the capacitance between the gate and the drain attributable to a shielding effect, and improving linearity and high power and high frequency characteristics through variation in the input voltage of the inner field-plate.
    Type: Grant
    Filed: July 1, 2009
    Date of Patent: April 13, 2010
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: Kyounghoon Yang, Sungsik Lee, Kiwon Lee, Kwangui Ko
  • Publication number: 20090261384
    Abstract: A gallium nitride high electron mobility transistor, in which an inner field-plate is disposed between the gate and drain of the high electron mobility transistor, so that an electric field is distributed between gate and drain regions to reduce a peak value and to reduce gate leakage current while maintaining high frequency performance, thus obtaining a high breakdown voltage, reducing the capacitance between the gate and the drain attributable to a shielding effect, and improving linearity and high power and high frequency characteristics through variation in the input voltage of the inner field-plate.
    Type: Application
    Filed: July 1, 2009
    Publication date: October 22, 2009
    Applicant: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Kyounghoon Yang, Sungsik Lee, Kiwon Lee, Kwangui Ko
  • Publication number: 20080073670
    Abstract: A gallium nitride high electron mobility transistor, in which an inner field-plate is disposed between the gate and drain of the high electron mobility transistor, so that an electric field is distributed between gate and drain regions to reduce a peak value and to reduce gate leakage current while maintaining high frequency performance, thus obtaining a high breakdown voltage, reducing the capacitance between the gate and the drain attributable to a shielding effect, and improving linearity and high power and high frequency characteristics through variation in the input voltage of the inner field-plate. The gallium-nitride high electron mobility transistor includes a gallium nitride buffer layer. An aluminum gallium-nitride barrier layer is formed on the buffer layer. A source electrode is placed on the barrier layer. A drain electrode is placed on the barrier layer to be spaced apart from the source electrode.
    Type: Application
    Filed: March 8, 2007
    Publication date: March 27, 2008
    Inventors: Kyounghoon Yang, Sungsik Lee, Kiwon Lee, Kwangui Ko