Patents by Inventor Kwok Leung Adam Chan

Kwok Leung Adam Chan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8368416
    Abstract: Methods and systems for testing an integrated circuit during an assembly process are described. The integrated circuit is received from inventory. The integrated circuit is placed in a socket on a first circuit board for system-level testing. The system-level testing is performed prior to placement and permanent attachment of the integrated circuit onto a second circuit board. Provided the integrated circuit passes the system-level testing, the placement and permanent attachment of the integrated circuit to the second circuit board is the next step following the system-level testing in the assembly process.
    Type: Grant
    Filed: September 11, 2007
    Date of Patent: February 5, 2013
    Assignee: NVIDIA Corporation
    Inventors: Marc E. King, Kwok Leung Adam Chan, Yufang Wang
  • Patent number: 7279887
    Abstract: Methods and systems for testing an integrated circuit during an assembly process are described. The integrated circuit is received from inventory. The integrated circuit is placed in a socket on a first circuit board for system-level testing. The system-level testing is performed prior to placement and permanent attachment of the integrated circuit onto a second circuit board. Provided the integrated circuit passes the system-level testing, the placement and permanent attachment of the integrated circuit to the second circuit board is the next step following the system-level testing in the assembly process.
    Type: Grant
    Filed: August 6, 2004
    Date of Patent: October 9, 2007
    Assignee: Nvidia Corporation
    Inventors: Marc E. King, Kwok Leung Adam Chan, Yufang Wang