Abstract: A semiconductor die includes: a semiconductor substrate; power semiconductor devices formed in the semiconductor substrate; and a field termination structure interposed between adjacent ones of the power semiconductor devices and between the power semiconductor devices and an edge of the semiconductor substrate.

Abstract: A circuit for reducing collector-emitter voltage (VCE) overshoot in an insulated gate bipolar transistor (IGBT) is provided. The circuit includes circuitry operable to generate a pulse which has a rising edge synchronized to the moment when collector or emitter current of the IGBT begins to fall during turn-off of the IGBT and a width which is a fraction of a duration of the VCE overshoot. The circuitry is further operable to combine the pulse with a control signal applied to a gate of the IGBT so as to momentarily raise the gate voltage of the IGBT during turn-off of the IGBT to above a threshold voltage of the IGBT for the duration of the pulse. A corresponding method of reducing VCE overshoot in an IGBT also is provided.

Abstract: A circuit for reducing collector-emitter voltage (VCE) overshoot in an insulated gate bipolar transistor (IGBT) is provided. The circuit includes circuitry operable to generate a pulse which has a rising edge synchronized to the moment when collector or emitter current of the IGBT begins to fall during turn-off of the IGBT and a width which is a fraction of a duration of the VCE overshoot. The circuitry is further operable to combine the pulse with a control signal applied to a gate of the IGBT so as to momentarily raise the gate voltage of the IGBT during turn-off of the IGBT to above a threshold voltage of the IGBT for the duration of the pulse. A corresponding method of reducing VCE overshoot in an IGBT also is provided.