Patents by Inventor Kwokming J. Cheng

Kwokming J. Cheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Metrology system for analyzing panel misregistration in a panel manufacturing process and providing appropriate information for adjusting panel manufacturing processes
    Patent number: 5206820
    Abstract: A metrology system to analyze panel misregistration in a panel manufacturing process includes a software controlled system which checks defined panel parameters on the four corners of a panel and related artwork for processing with a master pattern etched on a glass reference with a machine vision measuring system. The panel or artwork being checked is positioned by panel center registration means to align the center of the panel with the center of the master pattern. Displacement and rotational differences are entered under software control into a data base and analyzed by a stored program intelligent analyses system into a plurality of parameters based on a parameter model which permits an analysis of the cause of the misregistration.
    Type: Grant
    Filed: August 31, 1990
    Date of Patent: April 27, 1993
    Assignee: AT&T Bell Laboratories
    Inventors: Hans H. Ammann, Kwokming J. Cheng, Richard F. Kovacs, Henry B. Micks, Jr., Jamey Potechin, Everett Simons, Richard C. Steines, John G. Tetz