Patents by Inventor Kye-Hoon JEON

Kye-Hoon JEON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of inspecting a terminal of a component mounted on a substrate and substrate inspection apparatus
    Patent number: 10533952
    Abstract: A substrate inspection apparatus according to an embodiment of the present invention comprises a projection unit, an illumination unit, an image acquisition unit and a processing unit. The projection unit irradiates an inspection target with light for obtaining three-dimensional shape information of the inspection target. The illumination unit irradiates the inspection target with at least two lights having different colors. The image acquisition unit acquires a first image by receiving light irradiated by the projection unit and reflected from the inspection target, and a second image by receiving the lights irradiated by the illumination unit and reflected from the inspection target. The processing unit acquires brightness information and color information from the first image and the second image, respectively, which are acquired by the image acquisition unit, and acquires at least a portion of a boundary by using the bright information and the color information.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: January 14, 2020
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Kye-Hoon Jeon, Dal-An Kwon
  • METHOD OF INSPECTING A TERMINAL OF A COMPONENT MOUNTED ON A SUBSTRATE AND SUBSTRATE INSPECTION APPARATUS
    Publication number: 20190094151
    Abstract: A substrate inspection apparatus according to an embodiment of the present invention comprises a projection unit, an illumination unit, an image acquisition unit and a processing unit. The projection unit irradiates an inspection target with light for obtaining three-dimensional shape information of the inspection target. The illumination unit irradiates the inspection target with at least two lights having different colors. The image acquisition unit acquires a first image by receiving light irradiated by the projection unit and reflected from the inspection target, and a second image by receiving the lights irradiated by the illumination unit and reflected from the inspection target. The processing unit acquires brightness information and color information from the first image and the second image, respectively, which are acquired by the image acquisition unit, and acquires at least a portion of a boundary by using the bright information and the color information.
    Type: Application
    Filed: December 8, 2015
    Publication date: March 28, 2019
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Kye-Hoon JEON, Dal-An KWON