Abstract: A flash memory device including: a memory cell array; a signal generator inputting a first data fetch signal and outputting a second data fetch signal; and an output buffer circuit configured to output data from the memory cell array in sync with rising and falling edges of the second data fetch signal, wherein second data fetch signal is output along with data output from the output buffer circuit.

Abstract: A flash memory device including: a memory cell array; a signal generator inputting a first data fetch signal and outputting a second data fetch signal; and an output buffer circuit configured to output data from the memory cell array in sync with rising and falling edges of the second data fetch signal, wherein second data fetch signal is output along with data output from the output buffer circuit.

Abstract: A flash memory device including: a memory cell array; a signal generator inputting a first data fetch signal and outputting a second data fetch signal; and an output buffer circuit configured to output data from the memory cell array in sync with rising and falling edges of the second data fetch signal, wherein second data fetch signal is output along with data output from the output buffer circuit.

Abstract: A flash memory device including: a memory cell array; a signal generator inputting a first data fetch signal and outputting a second data fetch signal; and an output buffer circuit configured to output data from the memory cell array in sync with rising and falling edges of the second data fetch signal, wherein second data fetch signal is output along with data output from the output buffer circuit.

Abstract: A flash memory device including: a memory cell array; a signal generator inputting a first data fetch signal and outputting a second data fetch signal; and an output buffer circuit configured to output data from the memory cell array in sync with rising and falling edges of the second data fetch signal, wherein second data fetch signal is output along with data output from the output buffer circuit.

Abstract: A flash memory device including: a memory cell array; a signal generator inputting a first data fetch signal and outputting a second data fetch signal; and an output buffer circuit configured to output data from the memory cell array in sync with rising and falling edges of the second data fetch signal, wherein second data fetch signal is output along with data output from the output buffer circuit.

Abstract: A flash memory device including: a memory cell array; a signal generator inputting a first data fetch signal and outputting a second data fetch signal; and an output buffer circuit configured to output data from the memory cell array in sync with rising and falling edges of the second data fetch signal, wherein second data fetch signal is output along with data output from the output buffer circuit.

Abstract: A flash memory device includes a memory cell array, a clock signal input, an input for receiving a signal designating a writing operating mode, a plurality of data input/output pads, and a data input/output buffer circuit that is electrically connected to the clock signal input and to the plurality of data input/output pads. The data input/output buffer circuit is configured to receive data that is to be written to the memory cell array through the data input/output pads in synchronization with a clock signal that is applied to the clock signal input in response to activation of the signal designating the writing operating mode.

Abstract: A flash memory device includes a memory cell array, a clock signal input, an input for receiving a signal designating a writing operating mode, a plurality of data input/output pads, and a data input/output buffer circuit that is electrically connected to the clock signal input and to the plurality of data input/output pads. The data input/output buffer circuit is configured to receive data that is to be written to the memory cell array through the data input/output pads in synchronization with a clock signal that is applied to the clock signal input in response to activation of the signal designating the writing operating mode.

Abstract: A data output buffer switches it operating mode according to its operating frequency. The data output buffer includes a delay control unit, and a buffer unit. The buffer unit provides data of an internal buffer input line to an external buffer output line. The delay control unit generates a buffer enable signal corresponding to a received reference control signal. The buffer unit blocks the provision of the data to the buffer output line in response to a deactivation of the buffer enable signal. The buffer enable signal remains in an activated state when the period of the reference control signal is shorter than a reference period. The data output buffer may be included in a semiconductor memory device.

Abstract: A flash memory device includes a memory cell array, a clock signal input, an input for receiving a signal designating a writing operating mode, a plurality of data input/output pads, and a data input/output buffer circuit that is electrically connected to the clock signal input and to the plurality of data input/output pads. The data input/output buffer circuit is configured to receive data that is to be written to the memory cell array through the data input/output pads in synchronization with a clock signal that is applied to the clock signal input in response to activation of the signal designating the writing operating mode.

Abstract: A flash memory device including: a memory cell array; a signal generator inputting a first data fetch signal and outputting a second data fetch signal; and an output buffer circuit configured to output data from the memory cell array in sync with rising and falling edges of the second data fetch signal, wherein second data fetch signal is output along with data output from the output buffer circuit.

Abstract: A data output buffer switches it operating mode according to its operating frequency. The data output buffer includes a delay control unit, and a buffer unit. The buffer unit provides data of an internal buffer input line to an external buffer output line. The delay control unit generates a buffer enable signal corresponding to a received reference control signal. The buffer unit blocks the provision of the data to the buffer output line in response to a deactivation of the buffer enable signal. The buffer enable signal remains in an activated state when the period of the reference control signal is shorter than a reference period. The data output buffer may be included in a semiconductor memory device.

Abstract: A data output buffer switches it operating mode according to its operating frequency. The data output buffer includes a delay control unit, and a buffer unit. The buffer unit provides data of an internal buffer input line to an external buffer output line. The delay control unit generates a buffer enable signal corresponding to a received reference control signal. The buffer unit blocks the provision of the data to the buffer output line in response to a deactivation of the buffer enable signal. The buffer enable signal remains in an activated state when the period of the reference control signal is shorter than a reference period. The data output buffer may be included in a semiconductor memory device.

Abstract: A flash memory device includes a memory cell array, a clock signal input, an input for receiving a signal designating a writing operating mode, a plurality of data input/output pads, and a data input/output buffer circuit that is electrically connected to the clock signal input and to the plurality of data input/output pads. The data input/output buffer circuit is configured to receive data that is to be written to the memory cell array through the data input/output pads in synchronization with a clock signal that is applied to the clock signal input in response to activation of the signal designating the writing operating mode.

Abstract: A nonvolatile semiconductor memory device compensates for temperature changes by holding constant a bit line precharge level. A memory device according to the present invention may include an electrically programmable memory cell array connected to a plurality of word lines and a plurality of bit lines, a bit line voltage supplying circuit for supplying a bit line voltage to the bit lines, a shut-off circuit connecting the memory cell array and the bit line voltage supplying circuit, and a shut-off controlling circuit for controlling the shut off circuit. The shut-off controlling circuit may be constructed to compensate for temperature changes in order to hold the bit-line precharge level constant.

Abstract: A data output buffer switches it operating mode according to its operating frequency. The data output buffer includes a delay control unit, and a buffer unit. The buffer unit provides data of an internal buffer input line to an external buffer output line. The delay control unit generates a buffer enable signal corresponding to a received reference control signal. The buffer unit blocks the provision of the data to the buffer output line in response to a deactivation of the buffer enable signal. The buffer enable signal remains in an activated state when the period of the reference control signal is shorter than a reference period. The data output buffer may be included in a semiconductor memory device.

Abstract: In a non-volatile semiconductor memory device which differentially uses a start programming voltage during a programming operation mode in order to reduce a dispersion for the number of programming loops, the programming method includes previously storing a row address that indicates at least one specific word line among a plurality of word lines; and applying a start programming voltage to the specific word line, when a row address applied in a programming operation mode coincides with the stored row address, the start programming voltage having a level that is different from a level of start programming voltage to be applied to the rest word lines except the specific word line, whereby reducing dispersion for the programming loop number and realizing a high-speed programming operation and operating efficiency.

Abstract: A non-volatile memory device according to some embodiments of the invention includes a number of memory cells and a word line voltage generator circuit. The word line voltage generator circuit generates a program voltage that is applied to the memory cells every program loop of a program cycle. The word line voltage generator circuit may generate a program voltage for one program loop that is different from a program voltage for each of the remaining program loops. Other embodiments are described and claimed.

Abstract: In a non-volatile semiconductor memory device which differentially uses a start programming voltage during a programming operation mode in order to reduce a dispersion for the number of programming loops, the programming method includes previously storing a row address that indicates at least one specific word line among a plurality of word lines; and applying a start programming voltage to the specific word line, when a row address applied in a programming operation mode coincides with the stored row address, the start programming voltage having a level that is different from a level of start programming voltage to be applied to the rest word lines except the specific word line, whereby reducing dispersion for the programming loop number and realizing a high-speed programming operation and operating efficiency.