Patents by Inventor Kyeong II Heo

Kyeong II Heo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test board for testing IC devices operating in merged data output mode or standard mode
    Patent number: 6055657
    Abstract: During burn-in testing of IC devices, the devices operate in either merged data output mode for shortening the test time or in standard mode for detecting defective data output terminals of the devices. A single test board is provided to test the devices regardless of the operational mode. The test board wiring patterns electrically connect a predetermined number of merged data output terminals of the device to the I/O pins of the test board when the devices are in the merged data output mode. When the devices operate in the standard mode, the wiring patterns electrically connect all the output terminals of the devices to the I/O pins.
    Type: Grant
    Filed: November 10, 1997
    Date of Patent: April 25, 2000
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Kyeong II Heo, Young Kee Park