Abstract: The invention discloses an analysis method and an analysis system for analyzing an integrated circuit comprising a plurality of electronic components. The analysis method comprises steps of: performing a measurement or a simulation on an integrated circuit to obtain a time-domain waveform of an output signal of the integrated circuit; applying an time-frequency analysis to the time-domain waveform to obtain one or more frequency components; selecting a target frequency component from the one or more frequency components and identifying a point-in-time when an amplitude of the target frequency component changes; from the plurality of electronic components of the integrated circuit, identifying one or more target electronic components under an operating state at the point-in-time. The analysis system comprises a processing module and a memory module.