Patents by Inventor Kyle Lu

Kyle Lu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240066063
    Abstract: Compositions comprising and methods for the treatment of cancer using a NeoTCR based cell therapy with a modified TGF?RII expression.
    Type: Application
    Filed: May 18, 2023
    Publication date: February 29, 2024
    Applicant: PACT PHARMA, INC.
    Inventors: Charles W. TRAN, John D. Gagnon, Barbara Sennino, Stefanie Mandl-Cashman, Kyle Jacoby, William Lu, Michael Mayne Dubreuil, James S. Byers, III, Michal Mass, Alex Franzusoff
  • Patent number: 9537444
    Abstract: A method of quantum efficiency (QE) photovoltaic measurement is provided that includes coupling measurement electronics to a p-n junction of a Cell Under Test (CUT) that are capable of measuring a pulsed DC photocurrent. The measurement electronics output a response by the CUT to turning on and turning off the pulsed DC photocurrent that are digitized and analyzed for the magnitude that is representative of a conversion efficiency of the CUT to a wavelength of the DC photocurrent, where a measured decay time represents the p-n junction or the minority carrier lifetime. The CUT is exposed to the pulsed DC photocurrent, where signatures of the response to turning off and on to the pulsed DC photocurrent overlap, where a combined amplitude of the response is proportional to an efficiency of a production of photocarriers, where a value of a spectral response at a wavelength is determined.
    Type: Grant
    Filed: December 5, 2014
    Date of Patent: January 3, 2017
    Assignee: Tau Science Corporation
    Inventors: John M. Schmidt, Gregory S. Horner, Leonid A. Vasilyev, James E. Hudson, Kyle Lu
  • Publication number: 20150084664
    Abstract: A method of quantum efficiency (QE) photovoltaic measurement is provided that includes coupling measurement electronics to a p-n junction of a Cell Under Test (CUT) that are capable of measuring a pulsed DC photocurrent. The measurement electronics output a response by the CUT to turning on and turning off the pulsed DC photocurrent that are digitized and analyzed for the magnitude that is representative of a conversion efficiency of the CUT to a wavelength of the DC photocurrent, where a measured decay time represents the p-n junction or the minority carrier lifetime. The CUT is exposed to the pulsed DC photocurrent, where signatures of the response to turning off and on to the pulsed DC photocurrent overlap, where a combined amplitude of the response is proportional to an efficiency of a production of photocarriers, where a value of a spectral response at a wavelength is determined.
    Type: Application
    Filed: December 5, 2014
    Publication date: March 26, 2015
    Inventors: John M. Schmidt, Gregory S. Horner, Leonid A. Vasilyev, James E. Hudson, Kyle Lu