Patents by Inventor Kyoho Lee

Kyoho Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Registers for post configuration testing of programmable logic devices
    Patent number: 9575123
    Abstract: Various techniques are provided to implement user specified test registers locally on a PLD for use while the PLD is configured with a user design and tested. In one example, a machine-implemented method includes receiving, from an external test application, a data value at a programmable logic device (PLD) running configured user logic. The method also includes writing the data value into a test register of the PLD. The method also includes providing a control signal from the test register to the configured user logic in response to the data value. The method also includes switching operation of the configured user logic from a first test implementation to a second test implementation in response to the control signal.
    Type: Grant
    Filed: January 23, 2015
    Date of Patent: February 21, 2017
    Assignee: Lattice Semiconductor Corporation
    Inventors: Pradeep Lenka, Kyoho Lee, Andrew Lin
  • REGISTERS FOR POST CONFIGURATION TESTING OF PROGRAMMABLE LOGIC DEVICES
    Publication number: 20160216330
    Abstract: Various techniques are provided to implement user specified test registers locally on a PLD for use while the PLD is configured with a user design and tested. In one example, a machine-implemented method includes receiving, from an external test application, a data value at a programmable logic device (PLD) running configured user logic. The method also includes writing the data value into a test register of the PLD. The method also includes providing a control signal from the test register to the configured user logic in response to the data value. The method also includes switching operation of the configured user logic from a first test implementation to a second test implementation in response to the control signal.
    Type: Application
    Filed: January 23, 2015
    Publication date: July 28, 2016
    Inventors: Pradeep Lenka, Kyoho Lee, Andrew Lin