Abstract: Debugging a program in an apparatus using a lockstep method are more efficiently performed and a semiconductor apparatus includes a first processor core, a second processor core, a first debug circuit, a second debug circuit, and an error control circuit capable of outputting an error signal for stopping execution of a program by the first processor core and the second processor core. The second debug circuit performs setting regarding debugging different from that of the first processor core with respect to the second processor core. Even if a first processing result of the first processor core and a second processing result of the second processor core do not coincide with each other, the error control circuit invalidates the output of the error signal when the first processor core executes the program and the second processor core stops execution of the program based on the setting regarding debugging.

Abstract: Debugging a program in an apparatus using a lockstep method are more efficiently performed. A semiconductor apparatus includes a first processor core, a second processor core, a first debug circuit, a second debug circuit, and an error control circuit capable of outputting an error signal for stopping execution of a program by the first processor core and the second processor core. The second debug circuit performs setting regarding debugging different from that of the first processor core with respect to the second processor core. Even if a first processing result of the first processor core and a second processing result of the second processor core do not coincide with each other, the error control circuit invalidates the output of the error signal when the first processor core executes the program and the second processor core stops execution of the program based on the setting regarding debugging.