Patents by Inventor Kyong Min JIN

Kyong Min JIN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Battery defect screening device and method
    Patent number: 11656287
    Abstract: A battery defect screening device including a battery fixer for fixing a battery, a discharger, a charger, a voltmeter for measuring an initial voltage value, a first voltage value, and a second voltage value, and a defect screener for determining the battery to be normal when a first voltage change value, which is obtained by subtracting the first voltage value from the initial voltage value, is less than a first reference value, to have a hard short due to the foreign material when the first voltage change value is greater than the first reference value, to be normal when a second voltage change value, which is obtained by subtracting the second voltage value from the initial voltage value, is less than a second reference value, and to have a soft short due to the foreign material when the second voltage change value is greater than the second reference value.
    Type: Grant
    Filed: August 9, 2021
    Date of Patent: May 23, 2023
    Assignee: Samsung SDI Co., Ltd.
    Inventors: Se Hwan Moon, Joo Young Go, Tae Ho Kwon, Jae Kyung Kim, Hyung Sik Kim, Jae Seung Shin, Jeong Won Oh, Man Sang Yoon, Hyung Chun Lee, Kyong Min Jin
  • BATTERY DEFECT SCREENING DEVICE AND METHOD
    Publication number: 20220137150
    Abstract: A battery defect screening device including a battery fixer for fixing a battery, a discharger, a charger, a voltmeter for measuring an initial voltage value, a first voltage value, and a second voltage value, and a defect screener for determining the battery to be normal when a first voltage change value, which is obtained by subtracting the first voltage value from the initial voltage value, is less than a first reference value, to have a hard short due to the foreign material when the first voltage change value is greater than the first reference value, to be normal when a second voltage change value, which is obtained by subtracting the second voltage value from the initial voltage value, is less than a second reference value, and to have a soft short due to the foreign material when the second voltage change value is greater than the second reference value.
    Type: Application
    Filed: August 9, 2021
    Publication date: May 5, 2022
    Inventors: Se Hwan MOON, Joo Young GO, Tae Ho KWON, Jae Kyung KIM, Hyung Sik KIM, Jae Seung SHIN, Jeong Won OH, Man Sang YOON, Hyung Chun LEE, Kyong Min JIN