Patents by Inventor Kyoung Beom KIM

Kyoung Beom KIM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9111646
    Abstract: A chip tester includes a test unit suitable for performing a test on guarantee blocks and for detecting at least one second defective block from the guarantee blocks, a storage unit suitable for storing repair information, a determination unit suitable for comparing the number of available redundancy blocks, which are not allocated for first defective blocks, with the number of at least one second defective block, by referring to the repair information, and a guarantee block management unit suitable for updating the repair information to cancel allocation of at least one of a plurality of redundancy blocks based on a result of the comparison of the determination unit.
    Type: Grant
    Filed: November 12, 2013
    Date of Patent: August 18, 2015
    Assignee: SK Hynix Inc.
    Inventor: Kyoung Beom Kim
  • Publication number: 20140369144
    Abstract: A chip tester includes a test unit suitable for performing a test on guarantee blocks and for detecting at least one second defective block from the guarantee blocks, a storage unit suitable for storing repair information, a determination unit suitable for comparing the number of available redundancy blocks, which are not allocated for first defective blocks, with the number of at least one second defective block, by referring to the repair information, and a guarantee block management unit suitable for updating the repair information to cancel allocation of at least one of a plurality of redundancy blocks based on a result of the comparison of the determination unit.
    Type: Application
    Filed: November 12, 2013
    Publication date: December 18, 2014
    Applicant: SK HYNIX INC.
    Inventor: Kyoung Beom KIM