Abstract: A method for operating an electronic device includes detecting at least one lens module that is mounted on a camera module, wherein the at least one lens module is removable and recognized by a sensor module. The method further includes selectively activating a first operating system and a second operating system in accordance with the detected at least one lens module, wherein the second operating system is activated when a processor determines that a camera function has been performed. The method further includes changing the operating system that is being used in accordance with a change of the detected at least one lens module.

Abstract: Disclosed herein is an apparatus and method which is capable of accurately measuring surface status, such as a minute variation in height (the height difference), a protrusion, a depression, surface damage and/or surface roughness, at each point on the surface of the object to be measured in an optical manner. In particular, the present invention provides an optical surface measuring apparatus and method which is capable of accurately measuring the minute surface status of the object to be measured using both a signal from an interferometer and a Focus Error (FE) signal from a Position Sensitive Detector (PSD) in order to overcome the 2?-ambiguity of the conventional interferometers and the limitation of the Focus Error (FE) signal.

Abstract: Disclosed herein is an apparatus and method which is capable of accurately measuring surface status, such as a minute variation in height (the height difference), a protrusion, a depression, surface damage and/or surface roughness, at each point on the surface of the object to be measured in an optical manner. In particular, the present invention provides an optical surface measuring apparatus and method which is capable of accurately measuring the minute surface status of the object to be measured using both a signal from an interferometer and an FE signal from a Position Sensitive Detector (PSD) in order to overcome the 2?-ambiguity of the conventional interferometers and the limitation of the FE signal.