Abstract: A semiconductor integrated circuit having improved information processing function is disclosed. The integrated circuit comprises a semiconductor substrate, an information processing circuit fabricated on the substrate, a plurality of unit cells each having at least one transistor, a first discretionary wiring for connecting between transistors of the unit cells and a second discretionary wiring for connecting between the information processing circuit and some of the unit cells.

Abstract: A method for easily measuring surface temperature distribution of a sample consisting of a plurality of coexisting materials having different radiation factors at a specified temperature and a system for performing the surface temperature measuring method. In this measuring method, a sample is at first kept at a known temperature, and the amount of infrared rays radiated from a plurality of narrow regions divided on the surface of the sample is obtained. This measurement is performed at least twice at two known temperatures and therefrom temperature coefficients of infrared rays of each of a plurality of subdivided regions on the surface of the sample are then obtained. Succeedingly, with a sample being under the measuring condition, the amount of infrared rays radiated from a plurality of regions on the surface of the sample is measured.

Abstract: An electronic zoom image input method that enables zooming without declining the resolution by receiving an input image transmitted through a fixed focal distance optical system having a function of compressing the circumferential part of the input image by means of a photo detector with a uniform pixel density and subjecting the received image to image correction and conversion to obtain an output image. Three dimensional image input system is realized by preparing each image input system of both left and right view with this electronic zoom image input method.