Abstract: A light source and/or a deflector and/or the emitting end of an illuminating optical fiber is arranged in the rear focal plane of a lens for total internal reflection microscopy.

Abstract: A microscope objective includes an optical fiber. The optical fiber can deliver light for total internal reflection microscopy. The optical fiber can couple illumination light directly into the microscope objective through the optical fiber.

Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.

Abstract: A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.

Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.

Abstract: A microscope comprises an objective and a light source that produces an illumination light beam—in particular for evanescent illumination of a sample, which exhibits a focus in the plane of the objective pupil. To adjust the penetration depth, an adjustment mechanism is provided with which the spatial position of the focus within the plane of the objective pupil may be changed.

Abstract: A microscope with evanescent sample illumination comprises a device for optically manipulating a sample.

Abstract: A scanning microscope includes a light source for evanescently illuminating a sample disposed on a slide. A point detector receives detection light emanating from a scanning point of the sample. A beam deflection device disposed in an optical path of the detection light can shift a position of the scanning point.

Abstract: A microscope with a first and a second illumination light beam for illuminating a sample, wherein the first and/or the second illumination light beam evanescently illuminates the sample. For the purpose of CARS testing, the first illumination light beam can be a pump light beam, and the second illumination light beam can be a Stokes light beam. To increase resolution, the first illumination light beam can be an excitation light beam, and the second illumination light beam can be a stimulation light beam.

Abstract: The invention relates to a lens (1) for total internal reflection microscopy. The lens (1) is characterized in that a light source (5, 7) and/or at least one deviating means (31, 3) which deviates the light from a light source (5, 7) into the lens and/or the emitting end (35) of an illuminating optical fiber (37) is arranged in the region of the rear focal plane (3) of the lens (1).

Abstract: A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.

Abstract: A microscope with a first and a second illumination light beam for illuminating a sample, wherein the first and/or the second illumination light beam evanescently illuminates the sample. For the purpose of CARS testing, the first illumination light beam can be a pump light beam, and the second illumination light beam can be a Stokes light beam. To increase resolution, the first illumination light beam can be an excitation light beam, and the second illumination light beam can be a stimulation light beam.

Abstract: A microscope objective includes an optical fiber. The optical fiber can deliver light for total internal reflection microscopy. The optical fiber can couple illumination light directly into the microscope objective through the optical fiber.

Abstract: A microscope with evanescent sample illumination comprises a device for optically manipulating a sample.

Abstract: A microscope comprises an objective and a light source that produces an illumination light beam—in particular for evanescent illumination of a sample, which exhibits a focus in the plane of the objective pupil. To adjust the penetration depth, an adjustment mechanism is provided with which the spatial position of the focus within the plane of the objective pupil may be changed.

Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample comprises an adjustment mechanism with which the polarization of the illumination light beam may be changed.

Abstract: A microscope includes a light source that emits an illuminating light beam for illumination of a specimen, a beam splitter separating measuring light out of the illuminating light beam, and an apparatus for determining the light power level of the illuminating light beam. The apparatus for determining the light power level of the illuminating light beam receives the measuring light and includes an apparatus for simultaneous color-selective detection of the measuring light.

Abstract: The present invention discloses a light source (10) for the illumination of microscopic specimens. The invention also discloses a scanning microscope system that possesses a light source (10). The light source (10) emits a combined light beam that is emitted by a first laser (4) and a second laser (6). In the combined light beam, the light of the first laser (4) is synchronized with the light of the second laser (6).

Abstract: A scanning microscope having an acoustooptical component that splits out illuminating light for illumination of a sample from the output light of at least one light source, and conveys detected light proceeding from the sample to a detector, comprises, in the beam path of the output light from which the illuminating light is split out, at least one monitoring detector which is the measuring element of a control circuit. The scanning microscope is characterized in that fluctuations over time in the illuminating light power level are largely eliminated.

Abstract: An apparatus for controlling optical power in a microscope includes a measuring device for measuring the optical power, and a control unit for controlling a high-frequency source as a function of the measured optical power so as to achieve a selectable level of the optical power. The microscope includes a source providing light along an illumination beam path to a sample, a detector receiving detection light lead along a detection beam path from the sample, and an acousto-optical or electro-optical element located in the illumination beam path and driven by the high-frequency source.