Abstract: A probe card for testing electrical properties of a device under test (DUT) includes a plurality of semiconductor devices, which includes a substrate; and at least one transmission antenna, which is implemented as a chip on film (COF) type and attached to the substrate, wirelessly transmitting at least one of electric power and data to each of the plurality of semiconductor devices.

Abstract: A probe card for testing electrical properties of a device under test (DUT) includes a plurality of semiconductor devices, which includes a substrate; and at least one transmission antenna, which is implemented as a chip on film (COF) type and attached to the substrate, wirelessly transmitting at least one of electric power and data to each of the plurality of semiconductor devices.

Abstract: An apparatus for testing a semiconductor device includes: a power supplying unit for generating a voltage to be supplied to the semiconductor device under control of a test controller; a voltage transmitting unit for transmitting the voltage to the semiconductor device under control of the test controller; and an overcurrent detecting unit for detecting whether an overcurrent is supplied from an output of the power supplying unit, wherein the voltage transmitting unit cuts off a voltage supply to the semiconductor device in response to an output of the overcurrent detecting unit without intervention of the test controller.

Abstract: Disclosed is a network system and method for remotely controlling the automatic test equipment (or tester) in a semiconductor testing process. A plurality of clients remotely controls the tester through a server. The server comprises an operating system that is capable of communicating with various user interfaces and platforms. Accordingly, the tester may be remotely controlled, regardless of the particular platform of the client. Further, the tester may be remotely controlled on a web environment, as well as on a local area network linked to multiple workstations. The clients can also receive results of the tester to monitor the testing.