Abstract: A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.

Abstract: A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.

Abstract: A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.

Abstract: A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.

Abstract: Imaging techniques that may be used in applications such as differential phase contrast imaging are disclosed that include, for example, configuring a beam source and a beam detector such that a beam connects the two, positioning an object, a phase grating and an analyzer grating in the beam path, producing multiple data sets based on various analyzer grating positions, and conducting a regression analysis using a predetermined function having a set of fitting coefficients to establish those fitting coefficients. In those techniques, the fitting coefficients may be used to characterize a set of interference properties associated with the object.

Abstract: Imaging techniques that may be used in applications such as differential phase contrast imaging are disclosed that include, for example, configuring a beam source and a beam detector such that a beam connects the two, positioning an object, a phase grating and an analyzer grating in the beam path, producing multiple data sets based on various analyzer grating positions, and conducting a regression analysis using a predetermined function having a set of fitting coefficients to establish those fitting coefficients. In those techniques, the fitting coefficients may be used to characterize a set of interference properties associated with the object.