Patents by Inventor L. Suzanne Casement

L. Suzanne Casement has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6420705
    Abstract: A method and apparatus for the inspection of a substrate provides consistent detection of defects such as cracks, differentiates between different types of defects, and, does not excessively heat the substrate. An infrared radiating source produces infrared energy which illuminates the substrate in a uniform manner at an incident angle. An infrared camera collects a portion of the infrared light which is reflected from the substrate. An image is created from the collected light which includes indicia of the defect. The image is examined as the incident angle is varied for changes in the appearance of the indicia.
    Type: Grant
    Filed: March 29, 2001
    Date of Patent: July 16, 2002
    Assignee: TRW Inc.
    Inventors: Mau-Song Chou, Richard A. Chodzko, L. Suzanne Casement, Jonathan W. Arenberg
  • Publication number: 20010054693
    Abstract: A method and apparatus for the inspection of a substrate provides consistent detection of defects such as cracks, differentiates between different types of defects, and, does not excessively heat the substrate. An infrared radiating source produces infrared energy which illuminates the substrate in a uniform manner at an incident angle. An infrared camera collects a portion of the infrared light which is reflected from the substrate. An image is created from the collected light which includes indicia of the defect. The image is examined as the incident angle is varied for changes in the appearance of the indicia.
    Type: Application
    Filed: March 29, 2001
    Publication date: December 27, 2001
    Applicant: TRW Inc.
    Inventors: Mau-Song Chou, Richard A. Chodzko, L. Suzanne Casement, Jonathan W. Arenberg
  • Patent number: 6236044
    Abstract: A method and apparatus for the inspection of a substrate provides consistent detection of defects such as cracks, differentiates between different types of defects, and, does not excessively heat the substrate. An infrared radiating source produces infrared energy which illuminates the substrate in a uniform manner at an incident angle. An infrared camera collects a portion of the infrared light which is reflected from the substrate. An image is created from the collected light which includes indicia of the defect. The image is examined as the incident angle is varied for changes in the appearance of the indicia.
    Type: Grant
    Filed: August 21, 1998
    Date of Patent: May 22, 2001
    Assignee: TRW Inc.
    Inventors: Mau-Song Chou, Richard A. Chodzko, L. Suzanne Casement, Jonathan W. Arenberg