Patents by Inventor Ladd Johnson

Ladd Johnson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing circuits on substrate
    Publication number: 20060261833
    Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.
    Type: Application
    Filed: July 24, 2006
    Publication date: November 23, 2006
    Inventors: Timothy Boyle, Wayne Richter, Ladd Johnson, Lawrence Tom
  • Testing circuits on substrates
    Publication number: 20060119346
    Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.
    Type: Application
    Filed: October 4, 2005
    Publication date: June 8, 2006
    Inventors: Timothy Boyle, Wayne Richter, Ladd Johnson, Lawrence Tom
  • Testing circuits on substrate
    Publication number: 20050116731
    Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.
    Type: Application
    Filed: January 7, 2005
    Publication date: June 2, 2005
    Inventors: Timothy Boyle, Wayne Richter, Ladd Johnson, Lawrence Tom