Patents by Inventor Lai Peng Chew

Lai Peng Chew has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probing apparatus with on-probe device-mapping function
    Patent number: 8279451
    Abstract: One aspect of the present disclosure provides a probing apparatus with on-probe device-mapping function. A probing apparatus according to this aspect of the present disclosure comprises a housing, at least one probe stage positioned on the housing and configured to retain at least one probe, a device holder positioned in the housing and configured to receive at least one semiconductor device under test, and an inspection module having a predetermined field of view configured to capture an image showing at least the semiconductor device, wherein the probe stage includes a driving unit configured to move the probe out of focus of the inspection module in a mapping phase while keeping the device under test in the field of view of the optical inspection module.
    Type: Grant
    Filed: June 9, 2010
    Date of Patent: October 2, 2012
    Assignee: Star Technologies Inc.
    Inventors: Yong Yu Liu, Choon Leong Lou, Lai Peng Chew
  • Probing Apparatus with On-Probe Device-Mapping Function
    Publication number: 20110304857
    Abstract: One aspect of the present disclosure provides a probing apparatus with on-probe device-mapping function. A probing apparatus according to this aspect of the present disclosure comprises a housing, at least one probe stage positioned on the housing and configured to retain at least one probe, a device holder positioned in the housing and configured to receive at least one semiconductor device under test, and an inspection module having a predetermined field of view configured to capture an image showing at least the semiconductor device, wherein the probe stage includes a driving unit configured to move the probe out of focus of the inspection module in a mapping phase while keeping the device under test in the field of view of the optical inspection module.
    Type: Application
    Filed: June 9, 2010
    Publication date: December 15, 2011
    Applicant: STAR TECHNOLOGIES INC.
    Inventors: Yong Yu Liu, Choon Leong Lou, Lai Peng Chew