Patents by Inventor Lambert Stals

Lambert Stals has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5915838
    Abstract: An apparatus and method for measuring a parameter of a sample or component at a measurement temperature, wherein the parameter and the measurement temperature are measured at substantially the same time. A temperature coefficient of the sample or component is also established by using temperature fluctuations measured at or near the sample at the time at which the parameter is measured. The temperature coefficient is used to correct the measured parameter data and enhance its stability.
    Type: Grant
    Filed: May 19, 1998
    Date of Patent: June 29, 1999
    Assignees: IMEC vzw, Limburgs Universitaire Campus
    Inventors: Lambert Stals, Luc De Schepper, Jean Roggen, Ward De Ceuninck
  • Patent number: 5833365
    Abstract: An apparatus and method for measuring a parameter of a sample or component at a measurement temperature, wherein the parameter and the measurement temperature are measured at substantially the same time. A temperature coefficient of the sample or component is also established by using temperature fluctuations measured at or near the sample at the time at which the parameter is measured. The temperature coefficient is used to correct the measured parameter data and enhance its stability.
    Type: Grant
    Filed: March 22, 1996
    Date of Patent: November 10, 1998
    Assignees: Interuniversitair Micro-Electronika Centrum vzw, Limburgs Universitair Centrum
    Inventors: Lambert Stals, Luc De Schepper, Jean Roggen, Ward De Ceuninck