Patents by Inventor Lambertus Antonius Johannes VAN DE WIJDEVEN

Lambertus Antonius Johannes VAN DE WIJDEVEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240040972
    Abstract: A system (31) for determining at least one control parameter for at least one device (41) controlling an environmental condition in a plain growing environment is configured to obtain one or more target values for the environmental condition and receive information relating to control of a further environmental condition in the plant growing environment, e.g. from another system (1). The system is further configured to determine data which represent an anticipated influence of the control of the further environmental condition on the environmental condition from the information and determine the at least one control parameter for the at least one device controlling the environmental condition based on the one or more target values and the data. The system is also configured to output or store the at least one control parameter.
    Type: Application
    Filed: September 7, 2020
    Publication date: February 8, 2024
    Inventors: Marcellinus Petrus Carolus Michael KRIJN, Lambertus Antonius Johannes VAN DE WIJDEVEN, Rob Franciscus Maria VAN ELMPT
  • Publication number: 20230125027
    Abstract: The invention concerns a method comprising selecting a grow protocol, selecting an identifier of a container (45), associating the grow protocol with the container identifier, and determining an adjusted target value by applying an adjustment to a target value specified in the growth protocol. The method further comprises controlling an environmental control system (11-13, 27) based on the adjusted target value, obtaining measurement information associated with the container identifier from a device (23), determining a measured plant growth parameter value based on the measurement information, and comparing the measured plant growth parameter value with an expected plant growth parameter value. The method also comprises determining a merit related to a difference between the values and replacing the target value with the adjusted target value and the expected plant growth parameter value with the measured plant growth parameter value in dependence on the merit exceeding a threshold.
    Type: Application
    Filed: March 18, 2021
    Publication date: April 20, 2023
    Inventors: Marcellinus Petrus Carolus Michael KRIJN, Bartel Marinus VAN DE SLUIS, Rob Franciscus Maria VAN ELMPT, Thijs VAN DEN BERGH, Lambertus Antonius Johannes VAN DE WIJDEVEN