Patents by Inventor Lamin Ceesay

Lamin Ceesay has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Free space segment tester (FSST)
    Patent number: 10707585
    Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: July 7, 2020
    Assignee: KYMETA CORPORATION
    Inventors: Tom Hower, Lamin Ceesay, Benjamin Ash, Matthew Fornes, William Pedler, Mohsen Sazegar, Jacob Tyler Repp
  • FREE SPACE SEGMENT TESTER (FSST)
    Publication number: 20190229434
    Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.
    Type: Application
    Filed: March 29, 2019
    Publication date: July 25, 2019
    Inventors: Tom Hower, Lamin Ceesay, Benjamin Ash, Matthew Fornes, William Pedler, Mohsen Sazegar, Jacob Tyler Repp
  • Free space segment tester (FSST)
    Patent number: 10312600
    Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.
    Type: Grant
    Filed: May 16, 2017
    Date of Patent: June 4, 2019
    Assignee: KYMETA CORPORATION
    Inventors: Tom Hower, Lamin Ceesay, Benjamin Ash, Matthew Fornes, William Pedler, Mohsen Sazegar, Jacob Tyler Repp
  • FREE SPACE SEGMENT TESTER (FSST)
    Publication number: 20170338569
    Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.
    Type: Application
    Filed: May 16, 2017
    Publication date: November 23, 2017
    Inventors: Tom Hower, Lamin Ceesay, Benjamin Ash, Matthew Fornes, William Pedler, Mohsen Sazegar, Jacob Tyler Repp