Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage of the microscope. A mounting (100) for an ATR crystal (106) is carried on the support. The accessory includes a registration indicium which is located at a fixed position relative to the sample contacting area of the crystal. The registration indicium is preferably provided at the apex region of the crystal. The registration indicium can be used to ensure correct focussing of a sample when obtaining an image of the sample.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage of the microscope. A mounting (100) for an ATR crystal (106) is carried on the support. The accessory includes a registration indicium which is located at a fixed position relative to the sample contacting area of the crystal. The registration indicium is preferably provided at the apex region of the crystal. The registration indicium can be used to ensure correct focussing of a sample when obtaining an image of the sample.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage (20) of the microscope. A mounting (100) for an ATR crystal is carried on the support. The mounting (100) is preferably pivotally mounted on the support (40) so that it can be pivoted from a position in which the crystal lines on the axis of the microscope to a position in which a sample carried on the support can be observed visually. The mounting is arranged such that it can be returned reliably and reproducibly to its original position with the crystal on the axis.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be fixed to the moveable stage (20) of the microscope. A mounting member (100) is carried by the support (40). A sample supporting member (60) is disposed below the location of the ATR crystal (106). The sample supporting member (60) is carried on the support (40) such that it can be moved to restricted extent relative to the support and defines a sub-stage which can be moved relative to the main stage (20) of the microscope.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage of the microscope. A mounting (100) for an ATR crystal (106) is carried on the support. A sample supporting member (60) is disposed below the location of the ATR crystal. The sample supporting member (60) has a relatively thin upper wall (64). A pressure applying mechanism (80) is located below the wall (64) and is operable to apply pressure to a sample through the wall (64) to ensure good contact between a sample and the sample contacting surface of the crystal.

Abstract: An FT-IR microscope is operated in association with a scanning spectrometer in such a way that incremental movement of the movable stage of the microscope is synchronized with the scans of the scanning spectrometer. This minimizes delays in processing time.

Abstract: An FT-IR microscope is operated in association with a scanning spectrometer in such a way that incremental movement of the movable stage of 5 the microscope is synchronized with the scans of the scanning spectrometer. This minimizes delays in processing time.

Abstract: An optical system capable of providing a magnification which can be varied comprises a pair of ellipsoidal mirrors (20, 21) which are so mounted and arranged that the focus for radiation reflected from one mirror corresponds substantially with the input focus for the other mirror. The mirrors are preferably mounted so that they are pivotable.

Abstract: An optical system capable of providing a magnification which can be varied comprises a pair of ellipsoidal mirrors [(20, 21)]which are so mounted and arranged that the focus for radiation reflected from one mirror corresponds substantially with the input focus for the other mirror. The mirrors are preferably mounted so that they are pivotable.

Abstract: An optical system capable of providing a magnification which can be varied comprises a pair of ellipsoidal mirrors (20, 21) which are so mounted and arranged that the focus for radiation reflected from one mirror corresponds substantially with the input focus for the other mirror. The mirrors are preferably mounted so that they are pivotable.

Abstract: An infrared imaging microscope, particularly of the type used to carry out FT-IR measurements, is provided with an assembly (40) which can be moved into or out of the beam propagating to the microscope detector (32) in order to change the magnification provided by the optical elements of the microscope. The assembly (40) can be located between the objective Cassegrain mirror (18) and the intermedite focus position (42) of that mirror. In one example the assembly includes first and second spherical mirrors (44, 45). The assembly can be mounted so as to be rotatably movable between its positions in or out of the beam.