Abstract: A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.

Abstract: A simple, integrated control for pan and zoom of a display of data represented by a very long data record is in the form of a control knob having an outer ring for controlling pan and an inner knob for controlling a zoom factor. A zoom function is turned ON either by turning the inner knob (setting the zoom factor to a default value) or by (i) pressing an adjacent zoom or pan button or (ii) turning the outer ring (setting the zoom factor to a prior value when the zoom function was turned OFF). The zoom function may be turned OFF by turning the inner knob to set the zoom factor to 1× or by pressing the zoom button. The outer ring has individual positions divided into two groups: one group for controlling pan rate within a zoom window displaying a portion of the very long data record defined by a zoom box within a main window displaying the very long data record; and the other group for controlling pan rate of the zoom box within the main window for rapid movement from one end of the record to another.

Abstract: A test and measurement instrument includes a memory configured to store a digitized signal, a display configured to display the digitized signal, a mark interface configured to generate a mark creation signal, a processor coupled to the memory, the display, and the mark interface. The processor is configured to identify a feature of the digitized signal and create a mark indicating the feature and the digitized signal in response to the mark creation signal.