Abstract: An x-y robotic motion control system includes a controller, a first rail and a second rail spaced from the first rail wherein the first and second rails are substantially parallel to one another. A gantry has a first end movable along the first rail and a second end movable along the second rail. A payload is movable along the gantry and a position sensor is movable along the gantry with the payload. A first encoder is configured to detect the first end of the gantry with respect to the first rail, and a second encoder is configured to detect the second end of the gantry with respect to the second rail. The position sensor and the first and second encoders are coupled to the controller, which calculates a position of the payload as a function of signals from the position sensor and the first and second encoders.

Abstract: A system for sensing a three-dimensional topology of a test surface is provided. A first illumination source generates first patterned illumination from a first point of view. A second illumination source generates second patterned illumination from a second point of view, the second point of view differing from the first point of view. An area array image detector simultaneously acquires at least first and second fringe images relative to the first and second patterned illuminations. A controller is coupled to the first and second sources and to the detector. The controller generates a height topology of the test surface based on images acquired while the first and second patterned illuminators are energized.

Abstract: A method for mapping height of a feature upon a test surface is provided. The method includes projecting patterned illumination upon the feature, the patterned illumination having a plurality of distinct fringe periods. A first image of the feature is acquired while the patterned illumination is projected upon the feature. Relative movement is then generated between a sensor and the feature to cause relative displacement of a fraction of a field of view of a detector, the fraction being equal to about an inverse of the number of distinct regions of a reticle generating the pattern. Then, a second image of the feature is acquired while the patterned illumination is projected upon the feature. The height map is generated based, at least, upon the first and second images.

Abstract: A method for mapping height of a feature upon a test surface is provided. The method includes projecting patterned illumination upon the feature, the patterned illumination having a plurality of distinct fringe periods. A first image of the feature is acquired while the patterned illumination is projected upon the feature. Relative movement is then generated between a sensor and the feature to cause relative displacement of a fraction of a field of view of a detector, the fraction being equal to about an inverse of the number of distinct regions of a reticle generating the pattern. Then, a second image of the feature is acquired while the patterned illumination is projected upon the feature. The height map is generated based, at least, upon the first and second images.

Abstract: A system for sensing a three-dimensional topology of a test surface is provided. A first illumination source generates first patterned illumination from a first point of view. A second illumination source generates second patterned illumination from a second point of view, the second point of view differing from the first point of view. An area array image detector simultaneously acquires at least first and second fringe images relative to the first and second patterned illuminations. A controller is coupled to the first and second sources and to the detector. The controller generates a height topology of the test surface based on images acquired while the first and second patterned illuminators are energized.

Abstract: An x-y robotic motion control system includes a controller, a first rail and a second rail spaced from the first rail wherein the first and second rails are substantially parallel to one another. A gantry has a first end movable along the first rail and a second end movable along the second rail. A payload is movable along the gantry and a position sensor is movable along the gantry with the payload. A first encoder is configured to detect the first end of the gantry with respect to the first rail, and a second encoder is configured to detect the second end of the gantry with respect to the second rail. The position sensor and the first and second encoders are coupled to the controller, which calculates a position of the payload as a function of signals from the position sensor and the first and second encoders.

Abstract: Embodiments of the present invention improve upon component level inspection performed by pick and place machines. Such improvements include inspecting the pick operation in pick and place machines by collecting images of the pick event inside the machine and identifying errors as they happen. By detecting and displaying this information as it generated on the machine, the operator or machine can take prompt and effective corrective actions.

Abstract: An electronics assembly system includes an image acquisition system that is coupled to a controller through an improved interface. The coupling facilitates advanced monitoring and control of the image acquisition system. Multiple image acquisition systems can be coupled to the controller over the same interface.

Abstract: An electronics assembly system includes an image acquisition system that is coupled to a controller through an improved interface. The coupling facilitates advanced monitoring and control of the image acquisition system. Multiple image acquisition systems can be coupled to the controller over the same interface.

Abstract: An electronics assembly system includes an image acquisition system that is coupled to a controller through an improved interface. The coupling facilitates advanced monitoring and control of the image acquisition system. Multiple image acquisition systems can be coupled to the controller over the same interface.

Abstract: Uniform, microscopic perforated water soluble film is herein described, and its use in packaging solid, pelletized or particulate detersire compositions containing strong acids, strong bases or a source of halogen whereby the package provides air to pass through without leakage of its contents. Also described is a method of manufacture of a sealed, water soluble, detersire package with microscopic perforations and an apparatus for said manufacture.