Patents by Inventor Lance M. Capser

Lance M. Capser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Enhanced grading and sorting of semiconductor devices using modular “plug-in” sort algorithms
    Patent number: 6747228
    Abstract: A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules may test for the validity of a particular, selected grade of a memory or other semiconductor device based on the results of a test pattern associated with, or exhibited by, a particular device under test. Separating the test code from the main flow file of the test program into the aforementioned “plug-in” qualification or sort modules permits the test code to be much simpler and facilitates better organization, as each qualification or sort module may be independent of any other qualification or sort module and only determines in response to its associated test pattern whether or not (TRUE or FALSE) a device qualifies in a given device grade.
    Type: Grant
    Filed: January 22, 2002
    Date of Patent: June 8, 2004
    Assignee: Micron Technology, Inc.
    Inventor: Lance M. Capser
  • Enhanced grading and sorting of semiconductor devices using modular “plug-in” sort algorithms
    Patent number: 6563070
    Abstract: A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules may test for the validity of a particular, selected grade of a memory or other semiconductor device based on the results of a test pattern associated with, or exhibited by, a particular device under test. Separating the test code from the main flow file of the test program into the aforementioned “plug-in” qualification or sort modules permits the test code to be much simpler and facilitates better organization, as each qualification or sort module may be independent of any other qualification or sort module and only determines in response to its associated test pattern whether or not (TRUE or FALSE) a device qualifies in a given device grade.
    Type: Grant
    Filed: April 23, 1999
    Date of Patent: May 13, 2003
    Assignee: Micron Technology, Inc.
    Inventor: Lance M. Capser
  • Enhanced grading and sorting of semiconductor devices using modular "plug-in" sort algorithms
    Publication number: 20020079252
    Abstract: A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules may test for the validity of a particular, selected grade of a memory or other semiconductor device based on the results of a test pattern associated with, or exhibited by, a particular device under test. Separating the test code from the main flow file of the test program into the aforementioned “plug-in” qualification or sort modules permits the test code to be much simpler and facilitates better organization, as each qualification or sort module may be independent of any other qualification or sort module and only determines in response to its associated test pattern whether or not (TRUE or FALSE) a device qualifies in a given device grade.
    Type: Application
    Filed: February 21, 2002
    Publication date: June 27, 2002
    Inventor: Lance M. Capser
  • Enhanced grading and sorting of semiconductor devices using modular "plug-in" sort algorithms
    Publication number: 20020063085
    Abstract: A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules may test for the validity of a particular, selected grade of a memory or other semiconductor device based on the results of a test pattern associated with, or exhibited by, a particular device under test. Separating the test code from the main flow file of the test program into the aforementioned “plug-in” qualification or sort modules permits the test code to be much simpler and facilitates better organization, as each qualification or sort module may be independent of any other qualification or sort module and only determines in response to its associated test pattern whether or not (TRUE or FALSE) a device qualifies in a given device grade.
    Type: Application
    Filed: January 22, 2002
    Publication date: May 30, 2002
    Inventor: Lance M. Capser
  • ENHANCED GRADING AND SORTING OF SEMICONDUCTOR DEVICES USING MODULAR "PLUG-IN" SORT ALGORITHMS
    Publication number: 20010047953
    Abstract: A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules may test for the validity of a particular, selected grade of a memory or other semiconductor device based on the results of a test pattern associated with, or exhibited by, a particular device under test. Separating the test code from the main flow file of the test program into the aforementioned “plug in” qualification or sort modules permits the test code to be much simpler and facilitates better organization, as each qualification or sort module may be independent of any other qualification or sort module and only determines in response to its associated test pattern whether or not (TRUE or FALSE) a device qualifies in a given device grade.
    Type: Application
    Filed: April 23, 1999
    Publication date: December 6, 2001
    Inventor: LANCE M. CAPSER