Abstract: The invention includes digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edges. Embodiments of skewed logic devices in accordance with the present invention include inverters, buffers, NOR gates and NAND gates for rapidly propagating a selected “fast” edge of an input signal. Additional embodiments include pulse stretchers, memory devices, substrates, computer systems and methods incorporating the skewed logic devices of the present invention. Each embodiment of a skewed logic device of the present invention is configured to propagate either a fast rising edge or fast falling edge of an output signal, i.e., the “fast” edge, at rates comparable to those of domino logic. An advantage of the skewed logic devices of the present invention over conventional CMOS logic devices is rapid edge propagation. Additionally, virtually all of the input gate loading is devoted to the fast edge being propagated.

Abstract: The invention includes digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edges. Embodiments of skewed logic devices in accordance with the present invention include inverters, buffers, NOR gates and NAND gates for rapidly propagating a selected “fast” edge of an input signal. Additional embodiments include pulse stretchers, memory devices, substrates, computer systems and methods incorporating the skewed logic devices of the present invention. Each embodiment of a skewed logic device of the present invention is configured to propagate either a fast rising edge or fast falling edge of an output signal, i.e., the “fast” edge, at rates comparable to those of domino logic. An advantage of the skewed logic devices of the present invention over conventional CMOS logic devices is rapid edge propagation. Additionally, virtually all of the input gate loading is devoted to the fast edge being propagated.

Abstract: The invention includes digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edges. Embodiments of skewed logic devices in accordance with the present invention include inverters, buffers, NOR gates and NAND gates for rapidly propagating a selected “fast” edge of an input signal. Additional embodiments include pulse stretchers, memory devices, substrates, computer systems and methods incorporating the skewed logic devices of the present invention. Each embodiment of a skewed logic device of the present invention is configured to propagate either a fast rising edge or fast falling edge of an output signal, i.e., the “fast” edge, at rates comparable to those of domino logic. An advantage of the skewed logic devices of the present invention over conventional CMOS logic devices is rapid edge propagation. Additionally, virtually all of the input gate loading is devoted to the fast edge being propagated.

Abstract: The invention includes digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edges. Embodiments of skewed logic devices in accordance with the present invention include inverters, buffers, NOR gates and NAND gates for rapidly propagating a selected “fast” edge of an input signal. Additional embodiments include pulse stretchers, memory devices, substrates, computer systems and methods incorporating the skewed logic devices of the present invention. Each embodiment of a skewed logic device of the present invention is configured to propagate either a fast rising edge or fast falling edge of an output signal, i.e., the “fast” edge, at rates comparable to those of domino logic. An advantage of the skewed logic devices of the present invention over conventional CMOS logic devices is rapid edge propagation. Additionally, virtually all of the input gate loading is devoted to the fast edge being propagated.

Abstract: The invention includes digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edges. Embodiments of skewed logic devices in accordance with the present invention include inverters, buffers, NOR gates and NAND gates for rapidly propagating a selected “fast” edge of an input signal. Additional embodiments include pulse stretchers, memory devices, substrates, computer systems and methods incorporating the skewed logic devices of the present invention. Each embodiment of a skewed logic device of the present invention is configured to propagate either a fast rising edge or fast falling edge of an output signal, i.e., the “fast” edge, at rates comparable to those of domino logic. An advantage of the skewed logic devices of the present invention over conventional CMOS logic devices is rapid edge propagation. Additionally, virtually all of the input gate loading is devoted to the fast edge being propagated.

Abstract: The invention includes digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edges. Embodiments of skewed logic devices in accordance with the present invention included inverters, buffers, NOR gates, NAND gates for rapidly propagating a selected “fast” edge of an input signal. Additional embodiments include pulse stretchers, memory devices, substrates, computer systems and methods incorporating the skewed logic devices of the present invention. Each embodiment of a skewed logic device of the present invention is configured to propagate a either a fast rising edge or fast falling edge of an output signal, i.e., the “fast” edge, at rates comparable to those of domino logic. An advantage of the skewed logic devices of the present invention over conventional CMOS logic devices is rapid edge propagation. Additionally, virtually all of the input gate loading is devoted to the fast edge being propagated.

Abstract: A buffer having first and second input terminals and an output terminal. The buffer also includes a fast edge driver having an input terminal and an output terminal, with the input terminal connected to the first input terminal of the buffer, and the output terminal connected to the output terminal of the buffer. A shielding circuit is provided having an input terminal and an output terminal, with the input terminal connected to the second input terminal of the buffer. The buffer further includes a recovery circuit having an input terminal and an output terminal, with the input terminal connected to the output terminal of the shielding circuit, and the output terminal connected to the output terminal of the buffer.

Abstract: A buffer having first and second input terminals and an output terminal. The buffer also includes a fast edge driver having an input terminal and an output terminal, with the input terminal connected to the first input terminal of the buffer, and the output terminal connected to the output terminal of the buffer. A shielding circuit is provided having an input terminal and an output terminal, with the input terminal connected to the second input terminal of the buffer. The buffer further includes a recovery circuit having an input terminal and an output terminal, with the input terminal connected to the output terminal of the shielding circuit, and the output terminal connected to the output terminal of the buffer.

Abstract: A memory device provides a relaxed write timing scheme that improves access time. The address and/or the data is set up to the memory array during a previous write cycle so that the next write cycle can proceed without delays produced in delivering the address and/or the data to the array during the write cycle in which the data is to be written to the array.

Abstract: A synchronous circuit, such as an SRAM, includes core circuitry for processing input signals and multiple terminals for receiving, respectively, an input signal, an external clock signal and a control signal. The synchronous circuit includes a latch for receiving the input signal and an internal clock signal. The latch has an output connected to the core circuitry and can operate in a latched state and an unlatched state. The circuit also includes an internal clock controller for receiving the external clock signal and the control signal and for providing the internal clock signal to the latch to control transitions of the latch between the latched and unlatched states based on the external clock signal and the control signal.

Abstract: A buffer having first and second input terminals and an output terminal. The buffer also includes a fast edge driver having an input terminal and an output terminal, with the input terminal connected to the first input terminal of the buffer, and the output terminal connected to the output terminal of the buffer. A shielding circuit is provided having an input terminal and an output terminal, with the input terminal connected to the second input terminal of the buffer. The buffer further includes a recovery circuit having an input terminal and an output terminal, with the input terminal connected to the output terminal of the shielding circuit, and the output terminal connected to the output terminal of the buffer.

Abstract: The invention provides a memory access system and method of operation particularly useful with electronic storage devices having two or more memory units. Accessing of the memory units occurs one at a time and takes place using shared resources, such as shared row and column decoders. In a preferred embodiment, the invention permits the parallel reading of data from one memory unit of a plurality of memory units during a single system clock cycle using shared resources to perform addressing (e.g., read or write access) for the memory unit. The same shared resources are then used by any one of the other memory units during a subsequent system clock cycle to perform its own access function. By reading (or writing) data from (or to) one memory unit only during a single system clock cycle, the shared row and column decoders (and their attendant address lines) become available in a subsequent system clock cycle for use by another memory unit.

Abstract: A buffer having first and second input terminals and an output terminal. The buffer also includes a fast edge driver having an input terminal and an output terminal, with the input terminal connected to the first input terminal of the buffer, and the output terminal connected to the output terminal of the buffer. A shielding circuit is provided having an input terminal and an output terminal, with the input terminal connected to the second input terminal of the buffer. The buffer further includes a recovery circuit having an input terminal and an output terminal, with the input terminal connected to the output terminal of the shielding circuit, and the output terminal connected to the output terminal of the buffer.

Abstract: A memory device provides a relaxed write timing scheme that improves access time. The address and/or the data is set up to the memory array during a previous write cycle so that the next write cycle can proceed without delays produced in delivering the address and/or the data to the array during the write cycle in which the data is to be written to the array.

Abstract: Integrated circuit devices on a wafer are tested by the use of test circuit on the integrated circuit devices which is connected by means of a grid. The grid is used to enable the test circuitry, and provides an ability to test the devices while still on the wafer. This facilitates burning in the wafer prior to singulating the parts, since it is not necessary to separately establish electrical connections at contact points on the individual integrated circuit devices. In one embodiment, an oscillator may be adjusted in speed so that further tests may be effected by changing a test speed through the test circuit. Response of the integrated circuits at different operating speeds is determined by the adjustment of the oscillator speed so that a timing signal used for the testing may be varied.

Abstract: A test circuit is provided for an integrated circuit device, whereby an oscillator is provided on-chip and is activated by a test circuit. The test circuit provides an ability to test the devices while still on the wafer and facilitates burning in the wafer prior to singulating the parts, since it is not necessary to separately establish electrical connections at contact points on the individual integrated circuit devices. The oscillator may be adjusted in speed so that further tests may be effected by changing a test speed through the test circuit. Response of the DUT at different operating speeds is determined by the adjustment of the oscillator speed so that a timing signal used for the testing may be varied.

Abstract: A semiconductor wafer testing fixture facilitates burn-in testing of multiple wafers, whereby individual wafers have an array of individual die or integrated circuit chips with their own test circuitry. The wafer has Vcc and Vss buses provided thereon which are coupled to the individual integrated circuit chips and test circuitry. The fixture has a housing sized to accommodate multiple semiconductor wafers in a selected orientation. The wafers are supported within the housing on corresponding shelves, which provides a back bias voltage to the wafer. The fixture has first and second conductive arms for supplying selected voltages to the Vcc and Vss buses for imparting test cycling of the integrated circuits. The first arm has multiple hands which engage the Vcc buses on the wafers supported on corresponding shelves. Likewise, the second arm has multiple second hands which engage the Vss buses on the wafers supported on corresponding shelves.

Abstract: An SRAM having an input address bus, a memory array and coupled sense amplifiers, internal sense amp enable and output data bus enable nodes further includes a circuit for generating an asynchronous address transition signal from a series of address signals received on the input address bus, and a timing and control circuit. The timing and control circuit selects a single address signal and suppresses the other address signals within a predetermined period of time such as the normal cycle time of the SRAM. If the address transition signal includes a pulse train of two or more pulses spaced apart by less than the predetermined time interval, the timing and control circuit generates fixed pulse width sense amp enable and output data bus enable signals corresponding to the last pulse in the pulse train.

Abstract: Integrated circuit devices are fabricated with an additional conductive layer deposited on a semiconductor wafer onto which the semiconductor devices have been formed. The additional layer provides a conductive path to power the test circuits and allows the use of very few electrical connections in order to permit testing of the devices while still on the wafer. The ability to test the devices while still on the wafer facilitates burning in the wafer prior to singulating the parts, since it is not necessary to establish electrical connections at contact points on the individual integrated circuit devices. In one embodiment of the invention, the additional conductive layer is a metal mask and in a further aspect of that embodiment permits external connections to be accomplished at locations outside the die areas, thereby avoiding damage to the integrated circuit devices. Subsequent to testing of the die in wafer form, the metal mask is stripped and the die may be singulated.