Patents by Inventor Larry A. DeWerd

Larry A. DeWerd has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Compact sharpening filter for orthovoltage x-rays
    Patent number: 10525286
    Abstract: A sharpening filter for orthovoltage x-ray beams employs a substantially planar filter disk supporting a set of radial symmetric features controlling attenuation of x-ray transmission in concentric circular regions providing increased sharpness of the pencil beams in a compact filter structure that may be tailored to different beam sizes and focus depths.
    Type: Grant
    Filed: May 18, 2017
    Date of Patent: January 7, 2020
    Assignee: Wisconsin Alumni Research Foundation
    Inventors: Jessica Fagerstrom, Edward Bender, Wesley Culberson, Michael Lawless, Benjamin R. M. Palmer, Larry DeWerd
  • Compact Sharpening Filter For Orthovoltage X-Rays
    Publication number: 20180333592
    Abstract: A sharpening filter for orthovoltage x-ray beams employs a substantially planar filter disk supporting a set of radial symmetric features controlling attenuation of x-ray transmission in concentric circular regions providing increased sharpness of the pencil beams in a compact filter structure that may be tailored to different beam sizes and focus depths.
    Type: Application
    Filed: May 18, 2017
    Publication date: November 22, 2018
    Inventors: Jessica Fagerstrom, Edward Bender, Wesley Culberson, Michael Lawless, Benjamin R.M. Palmer, Larry DeWerd
  • High-resolution ion chamber
    Patent number: 8044365
    Abstract: Nested ionization chambers provide independent measurements of a radiation beam that does not fully irradiate the volume of one or both chambers. By mathematically combining these independent measurements, partial volume effects caused by a change in ionization detector calibrations when the full detector volume is not irradiated by the radiation beam, may be decreased, providing more accurate measurement of extremely small radiation beams.
    Type: Grant
    Filed: August 18, 2009
    Date of Patent: October 25, 2011
    Assignee: Standard Imaging, Inc.
    Inventors: Larry A. DeWerd, Brian D. Hooten, Edward W. Neumueller
  • High-Resolution Ion Chamber
    Publication number: 20100038528
    Abstract: Nested ionization chambers provide independent measurements of a radiation beam that does not fully irradiate the volume of one or both chambers. By mathematically combining these independent measurements, partial volume effects caused by a change in ionization detector calibrations when the full detector volume is not irradiated by the radiation beam, may be decreased, providing more accurate measurement of extremely small radiation beams.
    Type: Application
    Filed: August 18, 2009
    Publication date: February 18, 2010
    Inventors: Larry A. DeWerd, Brian D. Hooten, Edward W. Neumueller
  • Instrument for the measurement of x-ray beam characteristics
    Patent number: 4935950
    Abstract: An instrument for measuring the characteristics of an x-ray unit includes two pairs of photo detectors to measure the kVp of the x-ray beam, a single photo detector to measure the relative film exposure produced by the beam and another single photo detector used to measure the relative current in milliamps (mA) of the x-ray unit. The instrument multiplexes the signals and converts them to digital form for storage and analysis by a microprocessor. The output is a display the contents of which is user selectable either by a switch panel or through use of a remote control unit.
    Type: Grant
    Filed: November 28, 1988
    Date of Patent: June 19, 1990
    Assignee: Radiation Measurements, Inc.
    Inventors: Frank N. Ranallo, Larry A. DeWerd, Joseph Muehlenkamp