Patents by Inventor Larry Broach

Larry Broach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for semiconductor testing using yield correlation between global and class parameters
    Patent number: 6434725
    Abstract: A method for yield correlation for semiconductor chips, in accordance with the present invention, includes providing test data for a plurality of tests on each of a plurality of semiconductor chips. A global parameter is assigned to each chip as a quality measure based on the test data for that chip. Values for a plurality of parameter classes are determined, and each parameter class represents a parameter measured for each chip tested. A correlation between the values of the parameter classes and the global parameter values for the plurality of chips is then determined. The correlation for each of the parameter classes is compared to identify at least one parameter class, which detracts from chip yield.
    Type: Grant
    Filed: June 26, 2000
    Date of Patent: August 13, 2002
    Assignees: Infineon Technologies Richmond, LP, White Oak Semiconductor Partnership
    Inventors: Michael Bernhard Sommer, Larry Broach, Herbert Lammering