Patents by Inventor Larry J. Grieve

Larry J. Grieve has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • In-circuit Vt distribution bit counter for non-volatile memory devices
    Patent number: 7599236
    Abstract: Integrated testing components and testing algorithm on a non-volatile memory module provide faster Vt (threshold voltage) distributions during the module verification process. The memory module includes address and voltage scanning components and a bit counter for storing the number of 0's or 1's for a specified voltage. As the range of addresses are scanned across a range of voltages, the instances of the count value being counted is accumulated by the bit counter. Automated Tester Equipment (ATE) reads the accumulated count value for each tested voltage.
    Type: Grant
    Filed: June 7, 2006
    Date of Patent: October 6, 2009
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Richard K. Eguchi, Larry J. Grieve, Thomas Jew
  • In-circuit Vt distribution bit counter for non-volatile memory devices
    Publication number: 20070285986
    Abstract: Integrated testing components and testing algorithm on a non-volatile memory module provide faster Vt (threshold voltage) distributions during the module verification process. The memory module includes address and voltage scanning components and a bit counter for storing the number of 0's or 1's for a specified voltage. As the range of addresses are scanned across a range of voltages, the instances of the count value being counted is accumulated by the bit counter. Automated Tester Equipment (ATE) reads the accumulated count value for each tested voltage.
    Type: Application
    Filed: June 7, 2006
    Publication date: December 13, 2007
    Inventors: Richard K. Eguchi, Larry J. Grieve, Thomas Jew