Patents by Inventor Larry J. Webb

Larry J. Webb has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 3975680
    Abstract: A circuit circuit tester is provided for testing circuit runs of a circuit board for electrical continuity and electrical shorts. An electrical probe connected to one side of a capacitance meter is used to contact a particular circuit run, and an electrically conductive plate connected to the other side of the capacitance meter is maintained co-planar with and in close proximity to the circuit board to provide a suitable ground in the electrical test circuit, the capacitance of which circuit is a function of the electrical integrity of the circuit run. The measured capacitance is compared to a predetermined capacitance value for an identical circuit run of known acceptable quality to determine the electrical integrity of the tested circuit run.
    Type: Grant
    Filed: June 25, 1975
    Date of Patent: August 17, 1976
    Assignee: Honeywell Information Systems, Inc.
    Inventor: Larry J. Webb