Patents by Inventor Larry Ting

Larry Ting has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor metal interconnect reliability test structure
    Patent number: 6570181
    Abstract: A semiconductor reliability test structure (10) is formed on a face of a semiconductor substrate. The test structure (10) includes a chain of a plurality of long test links (12) formed of a first semiconductor material, where the plurality of long test links (12) is alternately interconnected by a plurality of short connecting links (14) formed of a second semiconductor material. The test structure (10) further includes first and second bond pads (20, 22) coupled to the first and second ends of the chain, respectively.
    Type: Grant
    Filed: October 24, 2000
    Date of Patent: May 27, 2003
    Assignee: Texas Instruments Incorporated
    Inventors: Carole D. Graas, Larry Ting