Abstract: A photogrammetry target includes a base including a first base side, configured to be fixedly mounted directly to a surface of a component, and a convex second base side opposite the first base side. The convex second base side is defined by a dome. The photogrammetry target further includes a plurality of retroreflective targets fixedly mounted to the dome. Each retroreflective target of the plurality of retroreflective targets includes a retroreflective surface facing a direction which is different than each other retroreflective surface of the plurality of retroreflective targets.

Abstract: An inspection method includes: receiving image data from a non-contact inspection system, the image data indicative of a plurality of captured images of light projected onto a component system comprising a component; processing the image data using a processing system to provide model data that models at least a portion of a surface of the component; comparing the model data to nominal data for a design model for the component using the processing system to determine a subset of the model data that is closest to the nominal data; identifying model data points in the subset of the model data based on identities of correlated nominal data points in the nominal data using the processing system to provide measurement data; and comparing the measurement data to design data for the design model for the component using the processing system to determine deviation between the measurement data and the design data.

Abstract: An inspection method includes: receiving image data from a non-contact inspection system, the image data indicative of a plurality of captured images of light projected onto a component system comprising a component; processing the image data using a processing system to provide model data that models at least a portion of a surface of the component; comparing the model data to nominal data for a design model for the component using the processing system to determine a subset of the model data that is closest to the nominal data; identifying model data points in the subset of the model data based on identities of correlated nominal data points in the nominal data using the processing system to provide measurement data; and comparing the measurement data to design data for the design model for the component using the processing system to determine deviation between the measurement data and the design data.