Abstract: The embodiments herein relate to a method for deriving topography of an object surface. A linearly polarized light wave is directed towards the object surface and a reference surface. Images of reflected linearly polarized light wave for a plurality of wavelengths are obtained. The images are obtained for at least four polarizations for each of the plurality of wavelengths. The reflected linearly polarized light wave is a reflection of the linearly polarized light wave directed towards the object surface and the reference surface. The topography of the object surface based on the obtained images is obtained.

Abstract: The embodiments herein relate to a method for deriving topography of an object surface. A linearly polarized light wave is directed towards the object surface and a reference surface. Images of reflected linearly polarized light wave for a plurality of wavelengths are obtained. The images are obtained for at least four polarizations for each of the plurality of wavelengths. The reflected linearly polarized light wave is a reflection of the linearly polarized light wave directed towards the object surface and the reference surface. The topography of the object surface based on the obtained images is obtained.

Abstract: Method and apparatus for determining the thickness of material layers of a container-held substance comprising a first material disposed in an upper layer and a second material disposed in a lower layer, by transmitting a radio signal through the substance towards a container portion; receiving reflected signals from a surface of the upper layer, a surface of the second layer, and the container portion; varying the frequency of the transmitted signal to determine phase displacement between transmitted and reflected signals; determining optical distances to the surfaces and the container portion, dependent on the phase displacements; determining the thickness of one of said layers dependent on phase displacement through and index of refraction of that layer; and determining the thickness of the other layer dependent on the thickness of said one of said layers.

Abstract: Method and apparatus for analyzing a substance in a container, the method comprising the steps of: disposing antenna means (3) at a predetermined geometrical distance (L) from a container portion (13); transmitting a signal from said antenna means through a surface portion (12) of the substance towards said container portion; receiving a first reflected signal in said antenna means from said container portion; determining a geometrical distance (L1) from the surface portion to the container portion; varying the frequency of the transmitted signal to determine a first phase displacement between the transmitted signal and the first reflected signal; determining an optical distance from the surface portion to the container portion based on the first phase displacement; and determining the index of refraction (nt) of said substance based on the optical and geometrical from the surface portion to the container portion.