Abstract: Method for determining at least one property of at least one first layer than can be applied to a substrate using terahertz, THz, radiation, comprising: determining at least one property of the substrate, applying the first layer to the substrate, determining the at least one property of the first layer.

Abstract: A measuring device comprises a Terahertz, THz, transmitter configured to emit a THz signal to an object to be measured and a THz receiver configured to receive a reflected portion of said THz signal that has been reflected by said object. The said THz transmitter and said THz receiver are arranged in a measuring head of said measuring device. The measuring device may vary a distance between said measuring head and said object to be measured, emit, by means of said THz transmitter, said THz signal to said object to be measured, receive said reflected portion of said THz signal, and determine a first parameter characterizing a detected signal proportional and/or related to said received reflected portion of said THz signal.

Abstract: An apparatus determines a layer thickness of a plurality of layers arranged on a body. The apparatus includes a THz transmitter configured to emit a THz signal to said plurality of layers and a THz receiver configured to receive a reflected portion of said THz signal that has been reflected by at least one layer of said plurality of layers. The apparatus is configured to determine the layer thickness of at least one of said plurality of layers based on said reflected portion of said THz signal. The apparatus further includes a distance measuring device for determining at least one parameter characterizing a distance between said apparatus and said body, wherein said distance measuring device may include at least one optical triangulation sensor.

Abstract: The invention relates to a method for processing data associated with a model characterizing a propagation of terahertz (THz) radiation in a spatial region, the spatial region comprising at least one terahertz device for emitting and/or receiving terahertz radiation and/or at least one object which can be subjected to terahertz radiation, said method comprising: providing the model; characterizing, by means of the model, a propagation of the terahertz radiation in the area of at least one boundary surface between two media that adjoin in the spatial region, wherein the model has a term that depends of at least one of the following elements: a) frequency of the terahertz radiation, b) spatial expansion of at least one of the two adjoining media, for example along a first spatial direction.

Abstract: Method for processing data associated with a model, wherein the model characterises a propagation of THz radiation, for example in the region of at least one terahertz device and/or at least one object that can be examined by means of the terahertz radiation, for example, wherein the method includes: analysing the model, wherein an analysis result is obtained, at least partially and/or intermittently saving the analysis result.

Abstract: An apparatus determines a layer thickness of a plurality of layers arranged on a body. The apparatus includes a THz transmitter configured to emit a THz signal to said plurality of layers and a THz receiver configured to receive a reflected portion of said THz signal that has been reflected by at least one layer of said plurality of layers. The apparatus is configured to determine the layer thickness of at least one of said plurality of layers based on said reflected portion of said THz signal. The apparatus further includes a distance measuring device for determining at least one parameter characterizing a distance between said apparatus and said body, wherein said distance measuring device may include at least one optical triangulation sensor.

Abstract: A measuring device comprises a Terahertz, THz, transmitter configured to emit a THz signal to an object to be measured and a THz receiver configured to receive a reflected portion of said THz signal that has been reflected by said object. The said THz transmitter and said THz receiver are arranged in a measuring head of said measuring device. The measuring device may vary a distance between said measuring head and said object to be measured, emit, by means of said THz transmitter, said THz signal to said object to be measured, receive said reflected portion of said THz signal, and determine a first parameter characterizing a detected signal proportional and/or related to said received reflected portion of said THz signal.