Patents by Inventor Laudie J. Doubrava

Laudie J. Doubrava has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9581675
    Abstract: System and methods may allow an operator of a signal measurement instrument to characterize and calibrate a network with unsupported connector types, e.g., not traceable to known standards. Adapters having supported and unsupported interfaces can be used to measure the system responses of networks in a system under test. These measurements can be mathematically cascaded to deduce virtual models that produce an accurate and fully calibrated total system response.
    Type: Grant
    Filed: February 21, 2013
    Date of Patent: February 28, 2017
    Assignee: TEKTRONIX, Inc.
    Inventors: Laudie J. Doubrava, Josiah A. Bartlett
  • Publication number: 20140058693
    Abstract: System and methods may allow an operator of a signal measurement instrument to characterize and calibrate a network with unsupported connector types, e.g., not traceable to known standards. Adapters having supported and unsupported interfaces can be used to measure the system responses of networks in a system under test. These measurements can be mathematically cascaded to deduce virtual models that produce an accurate and fully calibrated total system response.
    Type: Application
    Filed: February 21, 2013
    Publication date: February 27, 2014
    Applicant: TEKTRONIX, INC.
    Inventors: Laudie J. Doubrava, Josiah A. Bartlett
  • Patent number: 7271575
    Abstract: A system, apparatus and method for performing differential return loss measurements and other measurements as a function of frequency uses a digital storage oscilloscope (DSO) having spectral analysis functions. A waveform generator generates a differential test signal in the form of a series of pulses where each pulse includes spectral components associated with each of a plurality of frequencies of interest. A test fixture presents the differential test waveform to a load including at least one of a device under test (DUT), a short circuit, an open circuit and a balanced load. A signal acquisition device differentially measures the test waveform during each of the load conditions. The signal acquisition device computes an error correction parameter using measurements made during the short circuit, open circuit and balanced load conditions. The correction parameter tends to offset signal acquisition errors within measurements made during the DUT load condition.
    Type: Grant
    Filed: August 7, 2003
    Date of Patent: September 18, 2007
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Laudie J. Doubrava
  • Publication number: 20040027138
    Abstract: A system, apparatus and method for performing differential return loss measurements and other measurements as a function of frequency using a digital storage oscilloscope (DSO) including spectral analysis functions.
    Type: Application
    Filed: August 7, 2003
    Publication date: February 12, 2004
    Inventors: John J. Pickerd, Laudie J. Doubrava
  • Patent number: 6007347
    Abstract: A coaxial cable 24 has an outer conductor 74 surrounding an inner conductor 70. A portion 76 of the inner conductor 70 is stripped of insulation and extends beyond the end of the outer conductor at a cable end 30. A circuit board 12 has a major surface and defines an elongated slot 34. A connection end of the slot is defined by a stop portion of the board 36, and a conductive pad 60 is provided on the board surface adjacent the stop portion at the end of the slot. The stripped portion 76 of inner conductor 70 is connected to the conductive pad 60, and at least a portion of the outer conductor 74 is received in the slot, and may be connected to another contact on the board. The stop portion of the slot is defined as a peninsular connection tab 54 by an elongated hole 50 formed on each side of said stop portion 36 of said slot. The distance between the sides of the conductive pad 60 and the near edges of the elongated holes 50 is selected to provide a predetermined transition impedance.
    Type: Grant
    Filed: May 20, 1998
    Date of Patent: December 28, 1999
    Assignee: Tektronix, Inc.
    Inventors: Dennis Keldsen, Jim L. Martin, Laudie J. Doubrava