Abstract: A diffraction grating coupler which includes an optical waveguide having a first surface and a second surface opposing the first surface, the optical waveguide having a grating on one of its surfaces. The diffraction grating coupler further includes an elastic polymer film deposited on and attached to the optical waveguide, the elastic polymer film partially surrounding the optical waveguide and leaving one of the two surfaces of the optical waveguide open, the diffraction grating coupler being mountable on a specimen by attaching the elastic polymer film to the specimen.

Abstract: The invention relates to a system and method for detecting the displacement, such as the deflection, of a plurality of elements (1), such as microcantilevers, forming part of an array (2), by emitting a light beam (4) towards the array (2) and by receiving a reflected light beam on an optical position detector, whereby the position of incidence of the light beam is determined by the displacement of the corresponding element. The system further comprises: scanning means (7) for the displacing the light beam (4) along the array (2) so that the light beam is sequentially reflected, by the individual elements (1) along said array (2); and reflection detecting means (11) for detecting when the light beam is reflected by an element. The system is arranged so that when the reflection detecting means (11) detect that the light beam is reflected by an element, the corresponding position of incidence of the light on the detector is taken as an indication of the displacement of the element.

Abstract: The device for detecting changes in the refractive index of a dielectric medium comprises: at least one metallic layer (300) ready to be placed in contact with the dielectric medium (200); at least one light source (20) configured to direct transversal magnetic (TM) polarized light towards such metallic layer, so that the light is reflected on such metallic layer; coupling means (10); and at least one detector (31) configured to receive light reflected by the metallic layer and to detect at least one feature of such light. According to the invention, the metallic layer contains a ferromagnetic material. The invention also relates to a method.

Abstract: The device for detecting changes in the refractive index of a dielectric medium comprises: at least one metallic layer (300) ready to be placed in contact with the dielectric medium (200); at least one light source (20) configured to direct transversal magnetic (TM) polarized light towards such metallic layer, so that the light is reflected on such metallic layer; coupling means (10); and at least one detector (31) configured to receive light reflected by the metallic layer and to detect at least one feature of such light. According to the invention, the metallic layer contains a ferromagnetic material. The invention also relates to a method.

Abstract: The invention relates to a system and method for detecting the displacement, such as the deflection, of a plurality of elements (1), such as microcantilevers, forming part of an array (2), by emitting a light beam (4) towards the array (2) and by receiving a reflected light beam on an optical position detector, whereby the position of incidence of the light beam is determined by the displacement of the corresponding element. The system further comprises: scanning means (7) for the displacing the light beam (4) along the array (2) so that the light beam is sequentially reflected, by the individual elements (1) along said array (2); and reflection detecting means (11) for detecting when the light beam is reflected by an element. The system is arranged so that when the reflection detecting means (11) detect that the light beam is reflected by an element, the corresponding position of incidence of the light on the detector is taken as an indication of the displacement of the element.