Abstract: Test development tools, systems and/or methods which include accessing first and second pre-established test programs, each of said first and second pre-established test programs having been previously established for respective first and second pre-existing integrated circuit devices, and said first and second pre-established test programs each having respective first and second sets of subtest code portions; evaluating the first and second sets of subtest code portions and determining whether any respective subtest code portions of said first and second sets of subtest code portions have features allowing for combination in a new test program, said evaluating and determining steps providing at least one output result thereof; and defining a new test program including new subtest code portions for concurrently testing first and second pre-existing integrated circuit devices using the at least one output result of the evaluating and determining steps.

Abstract: Test development tools, systems and/or methods which include providing access to a pre-established serial test program having a series of test code portions; providing for evaluating the series of test code portions and determining whether any respective test code portions of the series of test code portions are independently operable thereby allowing for combination in a new test program, the evaluating and determining steps providing at least one output result thereof; and providing for defining a new test program including a new test code portion for at least partially concurrently testing first and second sub-parts of a device under test using the at least one output result of the evaluating and determining steps.