Abstract: Zone hints for use with a zoned namespace (ZNS) storage device. Zone hints include one or more of a first hint indicating that a zone is part of a group of a plurality of zones, a second hint indicating that the zone is to be fast-filled, or a third hint indicating that the zone is associated with a background operation. The first hint is structured to instruct the ZNS storage device to allocate to the zone a first storage resources that are physically adjacent to second storage resources reserved for others of the plurality of zones. The second hint is structured to instruct the ZNS storage device to bypass a staging area when writing to the zone. The third hint is structured to instruct the ZNS storage device to deprioritizing at least one operation writing to the zone, or to bypass the staging area when writing to the zone.

Abstract: A system includes reception of a request from a first application to create a virtual open-channel solid state drive associated with a first bandwidth and first capacity, association, in response to the request, of block addresses of a virtual address space of the first application with block addresses of one or more blocks of a first one of a first plurality of channels of a first open-channel solid state drive and with block addresses of one or more blocks of a second one of the first plurality of channels, reception, from the first application, of a first I/O call associated with one or more block addresses of the virtual address space, determination of block addresses of one or more blocks of the first one of the first plurality of channels which are associated with the one or more block addresses of the virtual address space, and execution of the first I/O call on the determined block addresses of one or more blocks of the first one of the first plurality of channels.

Abstract: The present invention extends to methods, systems, and computer program products for testing storage device power circuitry. A storage device controller includes an embedded test program. The storage device controller executes the test program in response to receiving a test command. In one aspect, the test program issues a plurality of different command patterns to test shared power circuitry of storage device components (e.g., shared by an array of NAND flash memory devices). The test program identifies a command pattern that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.

Abstract: A system includes reception of a request from a first application to create a virtual open-channel solid state drive associated with a first bandwidth and first capacity, association, in response to the request, of block addresses of a virtual address space of the first application with block addresses of one or more blocks of a first one of a first plurality of channels of a first open-channel solid state drive and with block addresses of one or more blocks of a second one of the first plurality of channels, reception, from the first application, of a first I/O call associated with one or more block addresses of the virtual address space, determination of block addresses of one or more blocks of the first one of the first plurality of channels which are associated with the one or more block addresses of the virtual address space, and execution of the first I/O call on the determined block addresses of one or more blocks of the first one of the first plurality of channels.

Abstract: A system includes reception of a request from a first application to create a virtual open-channel solid state drive associated with a first bandwidth and first capacity, association, in response to the request, of block addresses of a virtual address space of the first application with block addresses of one or more blocks of a first one of a first plurality of channels of a first open-channel solid state drive and with block addresses of one or more blocks of a second one of a second plurality of channels of a second open-channel solid state drive, reception, from the first application, of a first I/O call associated with one or more block addresses of the virtual address space, determination of block addresses of one or more blocks of the first one of the first plurality of channels which are associated with the one or more block addresses of the virtual address space, and execution of the first I/O call on the determined block addresses of one or more blocks of the first one of the first plurality of chan

Abstract: A system includes reception of a request from a first application to create a virtual open-channel solid state drive associated with a first bandwidth and first capacity, association, in response to the request, of block addresses of a virtual address space of the first application with block addresses of one or more blocks of a first one of a first plurality of channels of a first open-channel solid state drive and with block addresses of one or more blocks of a second one of a second plurality of channels of a second open-channel solid state drive, reception, from the first application, of a first I/O call associated with one or more block addresses of the virtual address space, determination of block addresses of one or more blocks of the first one of the first plurality of channels which are associated with the one or more block addresses of the virtual address space, and execution of the first I/O call on the determined block addresses of one or more blocks of the first one of the first plurality of chan

Abstract: An improved interface for managing disparate read, write, and erase sizes and operations in data storage devices is provided. By improving an interface between a storage system driver layer and associated storage devices, performance of data storage is improved, including improving data storage speed and storage media endurance. Storage media management operations are made more efficient and consistent by providing improved types and sequences of commands sent from the driver layer to the device control layer such that data write operations are performed in a sequential manner as write commands are directed to portions of data as opposed to buffering individual portions of data followed by a large wholescale write/erase process for the buffered data.

Abstract: Aspects extend to methods, systems, and computer program products for predicting solid state drive reliability. Aspects of the invention can be used to predict and/or to configure a data center to minimize one or more of: SSD capacity degradation (how much storage an SSD has left), SSD performance degradation (reduced read/write latency/throughput), and SSD failure. Models and data center considerations can be based on device level SSD related operations, such as, for example, read, write, erase. Operations decisions can be made for a data center based on SSD specific features, such as, for example, remaining capacity, write amplification factor, etc. Dependence and/or causality of various different data center factors can be leveraged. The impact of the various data center factors on different SSD failure modes and capacity/performance degradation can be quantified to drive SSD design, SSD provisioning, and SSD operations.

Abstract: Operations of a variety of components of a storage system stack are redefined to make the system more efficient when the underlying media has a “multi-log” type interface such as the case with NAND flash SSD memory or shingled magnetic recording media. The responsibilities of components of the storage system stack are modified such that each responsibility is performed at the most efficient component (level of abstraction) of the storage stack.

Abstract: Operations of a variety of components of a storage system stack are redefined to make the system more efficient when the underlying media has a “multi-log” type interface such as the case with NAND flash SSD memory or shingled magnetic recording media. The responsibilities of components of the storage system stack are modified such that each responsibility is performed at the most efficient component (level of abstraction) of the storage stack.

Abstract: Obtaining data about a peripheral device deployed in a computing environment. A method includes transmitting a primary data stream across a shared communication channel between the peripheral device and a host hosting the peripheral device. The method further includes transmitting on the shared communication channel, a secondary state information stream of consecutively occurring messages with peripheral device state information.

Abstract: Aspects extend to methods, systems, and computer program products for predicting solid state drive reliability. Aspects of the invention can be used to predict and/or to configure a data center to minimize one or more of: SSD capacity degradation (how much storage an SSD has left), SSD performance degradation (reduced read/write latency/throughput), and SSD failure. Models and data center considerations can be based on device level SSD related operations, such as, for example, read, write, erase. Operations decisions can be made for a data center based on SSD specific features, such as, for example, remaining capacity, write amplification factor, etc. Dependence and/or causality of various different data center factors can be leveraged. The impact of the various data center factors on different SSD failure modes and capacity/performance degradation can be quantified to drive SSD design, SSD provisioning, and SSD operations.

Abstract: The present invention extends to methods, systems, and computer program products for testing storage device power circuitry. A storage device controller includes an embedded test program. The storage device controller executes the test program in response to receiving a test command In one aspect, the test program issues a plurality of different command patterns to test shared power circuitry of storage device components (e.g., shared by an array of NAND flash memory devices). The test program identifies a command pattern that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.

Abstract: Operations of a variety of components of a storage system stack are redefined to make the system more efficient when the underlying media has a “multi-log” type interface such as the case with NAND flash SSD memory or shingled magnetic recording media. The responsibilities of components of the storage system stack are modified such that each responsibility is performed at the most efficient component (level of abstraction) of the storage stack.

Abstract: An improved interface for managing disparate read, write, and erase sizes and operations in data storage devices is provided. By improving an interface between a storage system driver layer and associated storage devices, performance of data storage is improved, including improving data storage speed and storage media endurance. Storage media management operations are made more efficient and consistent by providing improved types and sequences of commands sent from the driver layer to the device control layer such that data write operations are performed in a sequential manner as write commands are directed to portions of data as opposed to buffering individual portions of data followed by a large wholescale write/erase process for the buffered data.

Abstract: The present invention extends to methods, systems, and computer program products for testing storage device power circuitry. A storage device controller includes an embedded test program. The storage device controller executes the test program in response to receiving a test command. In one aspect, the test program issues a plurality of different command patterns to test shared power circuitry of storage device components (e.g., shared by an array of NAND flash memory devices). The test program identifies a command pattern that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.

Abstract: Obtaining data about a peripheral device deployed in a computing environment. A method includes transmitting a primary data stream across a shared communication channel between the peripheral device and a host hosting the peripheral device. The method further includes transmitting on the shared communication channel, a secondary state information stream of consecutively occurring messages with peripheral device state information.

Abstract: The present invention extends to methods, systems, and computer program products for testing storage device power circuitry. A storage device controller includes an embedded test program. The storage device controller executes the test program in response to receiving a test command. In one aspect, the test program issues a plurality of different command patterns to test shared power circuitry of storage device components (e.g., shared by an array of NAND flash memory devices). The test program identifies a command pattern that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.