Patents by Inventor Laurence Samuelson

Laurence Samuelson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for evaluating processes for manufacturing components
    Patent number: 7136776
    Abstract: Embodiments of the present invention pertain to methods of evaluating processes for manufacturing components. In one embodiment, an average probability of a first component to fail is calculated based on a measurement of a parameter where the first component was built using a new process. Another average probability of a second component to fail is calculated based on a measurement of the parameter where the second component was built using an existing process. A process index is calculated by determining a difference between the average probabilities for the second component and the first component. An estimation is made as to whether the new process is better than the existing process based on the process index.
    Type: Grant
    Filed: October 29, 2004
    Date of Patent: November 14, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Stephen Eichblatt, Laurence Samuelson
  • Method and apparatus for increasing uniformity in ion mill process
    Publication number: 20060198044
    Abstract: A method for increasing etch depth uniformity in ion milling process in a wafer manufacturing process encompasses loading designated regions of a production pallet with carriers containing wafers to be ion milled. These designated regions have been predetermined to exhibit similar and preferred depths of etching. Non-designated regions of the production pallet are then loaded with dummy carriers and the wafers are ion milled.
    Type: Application
    Filed: March 1, 2005
    Publication date: September 7, 2006
    Inventors: Pei Chen, Omar Montero Camacho, Laurence Samuelson, Yongjian Sun
  • Method for evaluating processes for manufacturing components
    Publication number: 20060106572
    Abstract: Embodiments of the present invention pertain to methods of evaluating processes for manufacturing components. In one embodiment, an average probability of a first component to fail is calculated based on a measurement of a parameter where the first component was built using a new process. Another average probability of a second component to fail is calculated based on a measurement of the parameter where the second component was built using an existing process. A process index is calculated by determining a difference between the average probabilities for the second component and the first component. An estimation is made as to whether the new process is better than the existing process based on the process index.
    Type: Application
    Filed: October 29, 2004
    Publication date: May 18, 2006
    Inventors: Stephen Eichblatt, Laurence Samuelson