Patents by Inventor Laurent EMMERICH

Laurent EMMERICH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for estimating a fragment count for the display of at least one three-dimensional object
    Patent number: 9823889
    Abstract: A method of estimating a fragment count for the display of at least one three-dimensional (3D) object. The method comprises determining an ellipsoid representative of a set of vertices defined by coordinates of the at least one 3D object, applying a transformation to the ellipsoid, calculating a projection area of the transformed ellipsoid, and estimating the fragment count for the display of the 3D object based at least partly on the calculated projection area of the transformed ellipsoid.
    Type: Grant
    Filed: January 8, 2013
    Date of Patent: November 21, 2017
    Assignee: NXP USA, Inc.
    Inventors: Robert Krutsch, Laurent Emmerich
  • METHOD AND APPARATUS FOR ESTIMATING A FRAGMENT COUNT FOR THE DISPLAY OF AT LEAST ONE THREE-DIMENSIONAL OBJECT
    Publication number: 20150317119
    Abstract: A method of estimating a fragment count for the display of at least one three-dimensional (3D) object. The method comprises determining an ellipsoid representative of a set of vertices defined by coordinates of the at least one 3D object, applying a transformation to the ellipsoid, calculating a projection area of the transformed ellipsoid, and estimating the fragment count for the display of the 3D object based at least partly on the calculated projection area of the transformed ellipsoid.
    Type: Application
    Filed: January 8, 2013
    Publication date: November 5, 2015
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Robert KRUTSCH, Laurent EMMERICH