Abstract: Disclosed is a system for generating wavelength-tunable, ultra-short light pulses within the visible or infrared light spectrum. The system includes an injection module including a light source and a wavelength-tunable spectral filter. The light source is suitable for generating short light pulses, having a duration measured in nanoseconds, within an emission spectrum having a spectral width of several tens of nanometers to several hundred nanometers. The spectral filter has a spectral width between 250 pm and 3 nm and is suitable for spectrally and temporally filtering the short light pulses such that the injection module generates wavelength-tunable, spectrally filtered, ultra-short light pulses. The system also includes at least one optical amplifier suitable for generating wavelength-tunable, ultra-short, amplified pulses based on the wavelength of the spectral filter.

Abstract: Disclosed is a system for generating wavelength-tunable, ultra-short light pulses within the visible or infrared light spectrum. The system includes an injection module including a light source and a wavelength-tunable spectral filter. The light source is suitable for generating short light pulses, having a duration measured in nanoseconds, within an emission spectrum having a spectral width of several tens of nanometers to several hundred nanometers. The spectral filter has a spectral width between 250 pm and 3 nm and is suitable for spectrally and temporally filtering the short light pulses such that the injection module generates wavelength-tunable, spectrally filtered, ultra-short light pulses. The system also includes at least one optical amplifier suitable for generating wavelength-tunable, ultra-short, amplified pulses based on the wavelength of the spectral filter.

Abstract: The invention concerns a detection system (7) for measuring at least one characteristic of an inked zone (5) comprising at least one sensor adapted to sense a light radiation reflected by said inked zone (5) and to generate a measurement signal representing at least the characteristic of the inked zone (5). Such a system further comprises at least one first optic fiber (10), adapted to convey up to the neighborhood of the inked zone (5), a light radiation emitted by a light source (11).

Abstract: This invention relates to a wide band optical gate in the terahertz domain (wavelengths in the far infrared). It comprises a first optical source (2) emitting a first beam (FTHz) in said terahertz domain, a first plate made of a semiconducting material (1) illuminated by said terahertz beam and a second optical source (3) emitting a second beam (FIR) at a wavelength capable of saturating the first plate (1) made of a semi-conducting material and making it reflective at terahertz wavelengths. This invention also relates to a system for measuring terahertz signals and to a terahertz generator. It is particularly applicable to systems for measuring terahertz signals and to terahertz generators.

Abstract: The invention concerns a detection system (7) for measuring at least one characteristic of an inked zone (5) comprising at least one sensor adapted to sense a light radiation reflected by said inked zone (5) and to generate a measurement signal representing at least the characteristic of the inked zone (5). Such a system further comprises at least one first optic fiber (10), adapted to convey up to the neighbourhood of the inked zone (5), a light radiation emitted by a light source (11).

Abstract: This invention relates to a wide band optical gate in the terahertz domain (wavelengths in the far infrared). It comprises a first optical source (2) emitting a first beam (FTHz) in said terahertz domain, a first plate made of a semiconducting material (1) illuminated by said terahertz beam and a second optical source (3) emitting a second beam (FIR) at a wavelength capable of saturating the first plate (1) made of a semi-conducting material and making it reflective at terahertz wavelengths. This invention also relates to a system for measuring terahertz signals and to a terahertz generator. It is particularly applicable to systems for measuring terahertz signals and to terahertz generators.

Abstract: A method for detecting chemical species present in a condensed medium including determining characteristic wavelengths and intensity values of back-scattered electromagnetic emission signals due to fluorescence of chemical species excited in response to a multiplicity of electromagnetic excitations of distinct wavelengths of at least one chemical species that could be contained in the condensed medium; successively exciting a multiplicity of surface elements of a surface portion of the condensed medium with a laser beam having tunable wavelength capable of taking on at least one of value of the distinct wavelengths of the multiplicity of electromagnetic excitations; successively recording wavelengths and intensity values of the electromagnetic emission signals back-scattered by each of the surface elements in response to the electromagnetic excitations produced by the beam; comparing at least one excitation wavelength and at least one corresponding emission wavelength of the recorded intensity value of the el

Abstract: The invention relates to a device for detecting chemical species present in a condensed medium, comprising means for determining the wavelength and the intensity values which are characteristic of electromagnetic transmission signals which are backscattered in response to a plurality of electromagnetic excitations, which have distinct wavelengths, of at least one chemical species which can be contained in the condensed medium; laser means producing a beam in order to excite the condensed medium; means for recording the wavelengths and the intensity values of backscattered electromagnetic transmission signals; and comparing and determining means for comparing the recorded intensity value of the electromagnetic signal, which is backscattered by the medium at a determined characteristic intensity value, with at least one corresponding transmission wavelength and excitation wave length.