Patents by Inventor Lauri Monica Nelson

Lauri Monica Nelson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160325132
    Abstract: An exercise device having a band/cord which extends and retracts from a housing. The apparatus allows users to conduct various physical workout exercises and also to generate electricity. The user is provided a variety of controllable functions related to exercising such as tracking and/or displaying information during the physical workout as well as tracking and displaying information related to the energy generated by the apparatus.
    Type: Application
    Filed: February 3, 2016
    Publication date: November 10, 2016
    Inventor: Lauri Monica Nelson
  • Patent number: 6639285
    Abstract: A method for making a semiconductor device is provided. The method allows for depositing a layer of a doped dielectric. The method further allows for executing plasma etching so that one or more etchant gases flow over the layer of doped dielectric. A redepositing step allows for redepositing another layer of doped dielectric over the plasma etched layer. The present invention enables to remove crystal defects that may be present in the doped dielectric surface and improve surface planarity.
    Type: Grant
    Filed: November 15, 2000
    Date of Patent: October 28, 2003
    Assignee: Agere Systems, Inc.
    Inventors: Jonathon Marlon Lobbins, Lauri Monica Nelson, Danica Deshone Smith, Dominique A. Wesby
  • Patent number: 6136615
    Abstract: A method is provided for performing in-line process checks in an integrated circuit fabrication process. The process checks are performed on actual product wafers, rather than control wafers. According to the method, production lots of product wafers are subjected to in-line testing. Selected wafers representing each chamber of the fabrication apparatus are tested for defects. Using the actual product wafers allows the detection of the quantity, size, type, composition, and even the cause of the defects. When defects are found, the fabrication process and apparatus are adjusted to avoid producing additional lots with undesirable defects.
    Type: Grant
    Filed: October 29, 1999
    Date of Patent: October 24, 2000
    Assignee: Lucent Technologies, Inc.
    Inventors: Lauri Monica Nelson, Mario Pita, Chester Lamar Harris