Patents by Inventor Lavi SHACHAR

Lavi SHACHAR has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of performing metrology operations and system thereof
    Patent number: 10571406
    Abstract: One or more metrology objects and one or more metrology operations may be identified. A design-based representation of a first metrology object of the one or more metrology objects may be received. Furthermore, an image-based representation of the first metrology object of the one or more metrology objects may be received where the one or more metrology operations include a first metrology operation associated with the first metrology object that is to be performed on the image-based representation of the first metrology object. The design-based representation of the first metrology object may be mapped with the image-based representation of the first metrology object. The first metrology operation may be performed based on the mapping.
    Type: Grant
    Filed: November 2, 2018
    Date of Patent: February 25, 2020
    Assignee: Applied Materials Israel Ltd.
    Inventors: Ron Katzir, Imry Kissos, Lavi Shachar, Amit Batikoff, Shaul Cohen, Noam Zac
  • METHOD OF PERFORMING METROLOGY OPERATIONS AND SYSTEM THEREOF
    Publication number: 20190121933
    Abstract: One or more metrology objects and one or more metrology operations may be identified. A design-based representation of a first metrology object of the one or more metrology objects may be received. Furthermore, an image-based representation of the first metrology object of the one or more metrology objects may be received where the one or more metrology operations include a first metrology operation associated with the first metrology object that is to be performed on the image-based representation of the first metrology object. The design-based representation of the first metrology object may be mapped with the image-based representation of the first metrology object. The first metrology operation may be performed based on the mapping.
    Type: Application
    Filed: November 2, 2018
    Publication date: April 25, 2019
    Inventors: Ron KATZIR, Imry KISSOS, Lavi SHACHAR, Amit BATIKOFF, Shaul COHEN, Noam ZAC