Patents by Inventor Lawane Luckett

Lawane Luckett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5748017
    Abstract: An improved system and method of determining the linearity of a ramp signal, including a ramp generator (11) for generating a ramp signal and a vernier delay (15) to provide scan stop signals where the samples are peak detected (17) and stored (21). The ramp generator (11) outputs are divided into equal sections controlled by a precise crystal controlled oscillator (25). The stored signals are processed and compared to detect errors.
    Type: Grant
    Filed: July 19, 1996
    Date of Patent: May 5, 1998
    Assignee: Texas Instruments Incorporated
    Inventors: Michael C. Storey, Lawane Luckett